Search Results - "Deenen, Patrick C."

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    Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions by Deenen, Patrick C., Middelhuis, Jeroen, Akcay, Alp, Adan, Ivo J. B. F.

    “…In complex manufacturing systems, such as a semiconductor wafer fabrication facility (wafer fab), it is important to accurately predict cycle times and…”
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    Journal Article
  3. 3

    Multi-Objective Optimization of a Sorting System by Smit, Arjan, Adan, Jelle, Deenen, Patrick C.

    Published in 2020 Winter Simulation Conference (WSC) (14-12-2020)
    “…This paper addresses the optimization of a sorting system encountered in the semiconductor industry. The system consists of parallel sorting machines and a…”
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    Conference Proceeding
  4. 4

    Predicting Cycle Time Distributions with Aggregate Modelling of Work Areas in a Real-World Wafer Fab by Deenen, Patrick C., Adan, Jelle, Fowler, John W.

    Published in 2021 Winter Simulation Conference (WSC) (12-12-2021)
    “…In a semiconductor wafer fabrication facility (wafer fab) it is important to accurately predict wafer outs, i.e. the remaining cycle time of the wafers in…”
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    Conference Proceeding
  5. 5

    Building a Digital Twin of the Photolithography Area of A Real-World Wafer FAB To Validate Improved Production Control by Deenen, Patrick C., Adriaensen, Rick A.M., Fowler, John W.

    Published in 2022 Winter Simulation Conference (WSC) (11-12-2022)
    “…Since the photolithography area is generally the bottleneck of a wafer fab, effective scheduling in this area can increase the performance of the complete fab…”
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    Conference Proceeding
  6. 6

    Wafer-to-Order Allocation in Semiconductor Back-End Production by Deenen, Patrick C., Adan, Jelle, Stokkermans, Joep, Adan, Ivo J.B.F., Akcay, Alp

    Published in 2019 Winter Simulation Conference (WSC) (01-12-2019)
    “…This paper discusses the development of an efficient algorithm that minimizes overproduction in the allocation of wafers to customer orders prior to assembly…”
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    Conference Proceeding
  7. 7

    Optimizing class-constrained wafer-to-order allocation in semiconductor back-end production by Deenen, Patrick C., Adan, Jelle, Akcay, Alp

    Published in Journal of manufacturing systems (01-10-2020)
    “…•Wafer-to-order allocation (also known as the lot-to-order matching or wafer assignment problem) in semiconductor back-end production is studied.•Introduction…”
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    Journal Article