Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions

This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient e...

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Bibliographic Details
Published in:	2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) pp. 1 - 4
Main Authors:	de Oliveira, Adria B., Benevenuti, Fabio, Benites, Luis A. C., Rodrigues, Gennaro S., Kastensmidt, Fernanda L., Added, Nemitala, Aguiar, Vitor A.P., Medina, Nilberto H., Silveira, Marcilei A.G., Debarge, Cedric
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-09-2018
Subjects:	Benchmark testing Fault-tolerance Field programmable gate arrays FPGA Hardware Heavy Ion Ions Rad-Hard Radiation hardening (electronics) Random access memory Redundancy Reliability engineering RHBD
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Summary:	This work investigates the influence of using the built-in configuration memory scrubber and triple modular hardware redundancy in the cross section of a radiation-hardened SRAM-based FPGA from NanoXplore. Different designs versions are investigated under heavy ions for the occurrence of transient errors, failures, and timeouts. The calculated dynamic cross-sections are in agreement with the expected order of magnitude of radiation hardened SRAM-based FPGAs. Results show that the most reliable configuration is using DSPs for the operational logic and applying full design redundancy combined with scrubbing.
ISSN:	1609-0438
DOI:	10.1109/RADECS45761.2018.9328683