Search Results - "DePanfilis, S."

A method for software quality planning, control, and evaluation by Boegh, J., Depanfilis, S., Kitchenham, B., Pasquini, A.

“…Squid is a method and a tool for quality assurance and a control that allows a software development organization to plan and control product quality during…”
Get full text

Local structure and size effects in nanophase palladium: An X-ray absorption study by de Panfilis, S., d'Acapito, F., Haas, V., Konrad, H., Weissmüller, J., Boscherini, F.

“…The connection between local structure and the grain size distribution in nanophase palladium is studied by X-ray absorption spectroscopy (XAFS) and X-ray…”
Get full text

Ambient temperature field measuring system for LHC superconducting dipoles by Billan, J., De Panfilis, S., Giloteaux, D., Pagano, O.

“…Performs acceptance tests including field measurements of the collared coils assembly of the LHC superconducting dipoles to estimate, at an early production…”
Get full text

Limits on the abundance and coupling of cosmic axions at m(a) of between 4.5 and 5.0 microeV by DePanfilis, S, Melissinos, A C, Moskowitz, B E, Rogers, J T, Semertzidis, Y K

“…Results from a search for galactic axions in the 4.5-5.0 microeV mass range, corresponding to the 1.09-1.22 GHz vacuum expectation energy range, are reported…”
Get full text

Limits on the abundance and coupling of cosmic axions at 4.5< m a <5.0 μeV by DePanfilis, S., Melissinos, A. C., Moskowitz, B. E., Rogers, J. T., Semertzidis, Y. K., Wuensch, W. U., Halama, H. J., Prodell, A. G., Fowler, W. B., Nezrick, F. A.

Get full text

Anomalous rf magnetoresistance in copper at 4 K by ROGERS, J. T, DE PANFILIS, S, MELISSINOS, A. C, MOSKOWITZ, B. E, SEMERTZIDIS, Y. K, WUENSCH, W. U, HALAMA, H. J, PRODELL, A. G, FOWLER, W. B, NEZRICK, F. A

“…We have measured the effect of a magnetic field on the surface resistance of polycrystalline Cu at f=1.2 GHz and at 4.4 K; under these conditions the surface…”
Get full text

Limits on the abundance and coupling of cosmic axions at 4.5<ma<5.0 microeV by DePanfilis, S, Melissinos, AC, Moskowitz, BE, Rogers, JT, Semertzidis, YK, Wuensch, WU, Halama, HJ, Prodell, AG, Fowler, WB, Nezrick, FA

Get full text