Search Results - "Daskalaki Mountanou, D."

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope by McAuliffe, T.P., Foden, A., Bilsland, C., Daskalaki Mountanou, D., Dye, D., Britton, T.B.

“…•Correlative electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS).•Unsupervised machine learning using principal component…”
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Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope by McAuliffe, T. P, Foden, A, Bilsland, C, Daskalaki-Mountanou, D, Dye, D, Britton, T. B

“…The routine and unique determination of minor phases in microstructures is critical to materials science. In metallurgy alone, applications include alloy and…”
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