Search Results - "Darowski, N."

Exchange bias in GeMn nanocolumns: The role of surface oxidation by Tardif, S., Cherifi, S., Jamet, M., Devillers, T., Barski, A., Schmitz, D., Darowski, N., Thakur, P., Cezar, J. C., Brookes, N. B., Mattana, R., Cibert, J.

“…We report on the exchange biasing of self-assembled ferromagnetic GeMn nanocolumns by GeMn-oxide caps. The x-ray absorption spectroscopy analysis of this…”
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Two-stage relaxation of damage structure in strongly creep-deformed single crystal superalloy SC16 measured by means of X-ray diffraction by Schumacher, G., Darowski, N., Zizak, I., Klingelhöffer, H., Neumann, W.

“…Specimens of single crystal superalloy SC16 were creep-strained at 1223 K along the [0 0 1] direction up to rupture using a creep stress of 150 MPa. After…”
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Neutron diffraction and synchrotron radiation studies of La1-xSrxCoO3 magnetic properties by Sikolenko, V, Sazonov, A, Efimov, V, Krivencov, V, Darowski, N, Vyalikh, D

“…Magnetic properties of the La1-xSrxCoO3 solid solutions have been studied by neutron diffraction and X-ray absorption near edge structure (XANES) measurements…”
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The growth and structure of titanium dioxide films on a Re(1 0 −1 0) surface: Rutile(0 1 1)-(2 × 1) by Rosenthal, D., Zizak, I., Darowski, N., Magkoev, T.T., Christmann, K.

“…Titanium dioxide films were grown on Re(1 0 −1 0) by Ti vapor deposition in oxygen at T = 830 K and studied by means of low-energy electron diffraction (LEED),…”
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Lattice distortion in γ′ precipitates of single crystal superalloy SC16 under creep deformation by Chen, W., Darowski, N., Zizak, I., Schumacher, G., Klingelhöffer, H., Neumann, W.

“…Specimens of single crystal superalloy SC16 were creep deformed at 1223K along [001] up to ±0.5% creep strain using stresses of −150MPa and +150MPa,…”
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Surface and bulk structural changes in InP single crystals induced by 350 Mev Au ion irradiation by Darowski, N., Zizak, I., Schumacher, G.

“…InP (0 0 1) wafers were irradiated at room temperature and at liquid nitrogen temperature with swift Au ions. The bulk and near surface structure was…”
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Surface crystallinity and radiation-amorphization of InP – An X-ray grazing incidence study by Darowski, N., Zizak, I., Schumacher, G., Klaumünzer, S., Wendler, E.

“…First results of a radiation-amorphization study of InP are presented which were obtained at a six-circle diffractometer operated at the bending magnet…”
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Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation by Grenzer, J., Darowski, N., Pietsch, U., Daniel, A., Rennon, S., Reithmaier, J. P., Forchel, A.

“…Focused Ga+ ion beam implantation was used to define a laterally periodic modulation of the electronic band gap in a GaAs/Ga0.97In0.03As/Al0.2Ga0.8As/GaAs…”
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X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires by Hesse, A., Zhuang, Y., Holý, V., Stangl, J., Zerlauth, S., Schäffler, F., Bauer, G., Darowski, N., Pietsch, U.

“…The elastic strain relaxation in a series of dry-etched periodic multilayer Si/SiGe wire samples with different etching depths was investigated systematically…”
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In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays by Darowski, N., Pietsch, U., Zhuang, Y., Zerlauth, S., Bauer, G., Lübbert, D., Baumbach, T.

“…The depth dependent strain relaxation in photolithographically defined and reactive ion etched Si/SiGe quantum wire and dot arrays is determined by high…”
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Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data by Pietsch, U, Darowski, N, Ulyanenkov, A, Grenzer, J, Wang, K.H, Forchel, A

“…The strain distribution of free-standing and buried lateral wire structures based on GaAs [0 0 1] containing a In 0.14Ga 0.86 As single quantum well were…”
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Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction by Darowski, N., Paschke, K., Pietsch, U., Wang, K., Forchel, A., Lübbert, D., Baumbach, T.

“…The triple-axis equipment under X-ray grazing incidence diffraction was applied for the first time in order to realise high-resolution investigations of the…”
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In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction by Zhuang, Y, Pietsch, U, Stangl, J, Holý, V, Darowski, N, Grenzer, J, Zerlauth, S, Schäffler, F, Bauer, G

“…Surface-sensitive X-ray grazing incidence diffraction (GID) was used to investigate the elastic strain relaxation in laterally periodic Si/SiGe wires, oriented…”
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X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures by Darowski, N., Pietsch, U., Wang, K.-H., Forchel, A., Shen, Q., Kycia, S.

“…The morphology and the strain relaxation of a laterally patterned GaAs/Ga 0.86In 0.14As/GaAs surface wire structure on GaAs [001] were studied before and after…”
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Grazing incidence diffraction by epitaxial multilayered gratings by Baumbach, G.T, Lübbert, D, Pietsch, U, Darowski, N, Leprince, L, Talneau, A, Schneck, J

“…Multilayered gratings have been investigated by high-resolution grazing incidence diffraction, employing non-coplanar triple crystal diffractometry. A…”
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X-ray diffraction from quantum wires and quantum dots by Zhuang, Y, Stangl, J, Darhuber, A A, Bauer, G, Mikuli´k, P, Holy´, V, Darowski, N, Pietsch, U

“…From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples…”
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X-ray measurements with micro- and nanoresolution at BESSY by Gupta, A., Darowski, N., Zizak, I., Meneghini, C., Schumacher, G., Erko, A.

“…Capabilities of the KMC-2 beamline at BESSY for spatially resolved X-ray measurements with micro- and nanometer resolution have been reviewed. A combination of…”
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Grain rotation in nanocrystalline layers under influence of swift heavy ions by Zizak, Ivo, Darowski, Nora, Klaumünzer, Siegfried, Schumacher, Gerhard, Gerlach, Jürgen W., Assmann, Walter

“…Significant changes in texture occur in nanocrystalline Ti, TiN and NiO layers during irradiation with 350 MeV Au ions. The angle between ion beam and layer…”
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Nucleation at the phase transition near 40 ° C in MnAs nanodisks by Jenichen, B., Takagaki, Y., Ploog, K. H., Darowski, N., Feyerherm, R., Zizak, I.

“…The phase transition near 40 ° C of both as-grown thin epitaxial MnAs films prepared by molecular beam epitaxy on GaAs(001) and nanometer-scale disks…”
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Surface and bulk structural changes in InP single crystals induced by 350 Mev Au ion irradiation by Darowski, N, Zizak, I, Schumacher, G

“…InP (001) wafers were irradiated at room temperature and at liquid nitrogen temperature with swift Au ions. The bulk and near surface structure was…”
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