Search Results - "Darbal, A. D."

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  1. 1

    Precessed electron beam electron energy loss spectroscopy of graphene: Beyond channelling effects by Yedra, Ll, Torruella, P., Eljarrat, A., Darbal, A. D., Weiss, J. K., Peiró, F., Estradé, S.

    Published in Applied physics letters (04-08-2014)
    “…The effects of beam precession on the Electron Energy Loss Spectroscopy (EELS) signal of the carbon K edge in a 2 monolayer graphene sheet are studied. In a…”
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    Journal Article
  2. 2

    Cross-sectional stress distribution in AlxGa1-xN heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction by Reisinger, M., Zalesak, J., Daniel, R., Tomberger, M., Weiss, J.K., Darbal, A.D., Petrenec, M., Zechner, J., Daumiller, I., Ecker, W., Sartory, B., Keckes, J.

    Published in Materials & design (15-09-2016)
    “…A residual stress depth gradient is characterized in a 1.8μm thick AlN/Al0.25Ga0.75N/GaN/Al0.22Ga0.78N heteroepitaxial structure grown using metallic-organic…”
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    Journal Article
  3. 3

    Nanoscale Automated Phase and Orientation Mapping in the TEM by Darbal, A. D., Gemmi, M., Portillo, J., Rauch, E., Nicolopoulos, S.

    Published in Microscopy today (01-11-2012)
    “…The limitation of spatial resolution in orientation imaging via electron backscattered diffraction analysis in the scanning electron microscope (SEM) makes it…”
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    Magazine Article