Search Results - "Dang, G. T."
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Bandgap engineering of α-(AlxGa1-x)2O3 by a mist chemical vapor deposition two-chamber system and verification of Vegard's Law
Published in Applied physics letters (06-08-2018)“…This work reports growth of α-(AlxGa1-x)2O3 single crystals with high incorporation of Al by a Mist Chemical Vapor Deposition two-chamber system, which was…”
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2
Electrical effects of plasma damage in p-GaN
Published in Applied physics letters (25-10-1999)“…The reverse breakdown voltage of p-GaN Schottky diodes was used to measure the electrical effects of high density Ar or H2 plasma exposure. The near surface of…”
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3
Relationship between osteopenia and lumbar intervertebral disc degeneration in ovariectomized rats
Published in Calcified tissue international (01-09-2004)“…Ovariectomy (OVX) can cause bone loss in rats, but little is known about how it also induces lumbar intervertebral disc degeneration (LVD). This study…”
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4
Depth and thermal stability of dry etch damage in GaN Schottky diodes
Published in Applied physics letters (12-07-1999)“…GaN Schottky diodes were exposed to N2 or H2 inductively coupled plasmas prior to deposition of the rectifying contact. Subsequent annealing, wet photochemical…”
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5
In vitro and in vivo induction of bone formation based on ex vivo gene therapy using rat adipose-derived adult stem cells expressing BMP-7
Published in Cytotherapy (Oxford, England) (2005)“…Adipose-derived adult stem (ADAS) cells are multipotent cells capable of differentiating into osteoblasts, adipocytes and chondrocytes. The aim of this study…”
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6
Schottky diode measurements of dry etch damage in n- and p-type GaN
Published in Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (01-07-2000)“…n- and p-type GaN was exposed to inductively coupled plasma of N 2 , H 2 , Ar, or Cl 2 / Ar , as a function of source power (0–1000 W) and rf chuck power…”
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Conference Proceeding Journal Article -
7
Occupational heat-related illness emergency department visits and inpatient hospitalizations in the southeast region, 2007-2011
Published in American journal of industrial medicine (01-10-2015)“…Background Heat‐related illness (HRI) is an occupational health risk for many outdoor, and some indoor, workers. Methods Emergency department (ED) and…”
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8
Fabrication and characteristics of high-speed implant-confined index-guided lateral-current 850-nm vertical cavity surface-emitting lasers
Published in Journal of lightwave technology (01-04-2003)“…Process technology of high-speed implant-apertured index-guide lateral-current-injection top dielectric-mirror quantum-well 850-nm vertical cavity…”
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9
Growth and fabrication of GaN/AlGaN heterojunction bipolar transistor
Published in Applied physics letters (03-05-1999)“…A GaN/AlGaN heterojunction bipolar transistor structure with Mg doping in the base and Si doping in the emitter and collector regions was grown by metalorganic…”
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10
Temperature dependence of GaN high breakdown voltage diode rectifiers
Published in Solid-state electronics (01-04-2000)“…The temperature dependence of reverse breakdown voltage ( V RB) and forward turn-on voltage ( V F) of GaN Schottky diode rectifiers is reported. The V RB…”
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11
Plasma damage in p-GaN
Published in Journal of electronic materials (01-03-2000)“…The effect of Inductively Coupled Plasma H sub(2) or Ar discharges on the breakdown voltage of p-GaN diodes was measured over a range of ion energies and…”
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12
Surface and bulk leakage currents in high breakdown GaN rectifiers
Published in Solid-state electronics (01-04-2000)“…GaN Schottky diode rectifiers with contact diameters 125–1100 μm were fabricated on thick (4 μm) epi layers. At low reverse bias voltages the leakage current…”
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13
High breakdown voltage Au/Pt/GaN Schottky diodes
Published in Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (01-07-2000)“…Au/Pt/GaN Schottky diode rectifiers were fabricated with reverse breakdown voltage (V RB ) up to 550 V on vertically depleting structures and >2000 V on…”
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Conference Proceeding Journal Article -
14
Sub-μm features patterned with laser interference lithography for the epitaxial lateral overgrowth of α-Ga2O3 via mist chemical vapor deposition
Published in Applied physics letters (26-07-2021)“…The low growth rate of mist chemical vapor deposition normally requires a long growth time to achieve coalescence in the epitaxial lateral overgrowth of…”
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15
A codon 891 exon 15 RET proto-oncogene mutation in familial medullary thyroid carcinoma: a detection strategy
Published in Molecular and cellular probes (01-02-1999)“…A ser891ala RET proto-oncogene mutation has been previously discovered in a single kindred with familial medullary thyroid carcinoma (FMTC). An additional two…”
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16
Effects of Intermixing on Gain and Alpha Factors of Quantum-Dash Lasers
Published in IEEE photonics technology letters (01-10-2008)“…Gain and alpha factors were measured on InAs-InAlGaAs quantum-dash lasers with their heterostructures intermixed by either a dielectric-capping or…”
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17
GaN n- and p-type Schottky diodes: Effect of dry etch damage
Published in IEEE transactions on electron devices (01-07-2000)“…The reverse breakdown voltage (V/sub B/) and forward turn-on voltage (V/sub F/) of n- and p-GaN Schottky diodes were used to examine the effects of Cl/sub…”
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18
p-Ohmic contact resistance for GaAs(C)/GaN(Mg)
Published in Solid-state electronics (2000)“…Heavily carbon-doped (p≥10 10 cm −3) GaAs layers were grown on p-GaN in attempt to reduce the p-ohmic contact resistance. While the specific contact…”
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19
InGaAs/GaAs Quantum-Dot Superluminescent Diode for Optical Sensor and Imaging
Published in IEEE sensors journal (01-02-2007)“…We report on the design and fabrication of a novel wideband superluminescent diode (SLD) based on InGaAs/GaAs quantum-dot structure. In this device, we…”
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Comparison of GaN p-i-n and Schottky rectifier performance
Published in IEEE transactions on electron devices (01-03-2001)“…The performance of GaN p-i-n and Schottky rectifiers fabricated on the same wafer was investigated as a function of device size and operating temperature…”
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