Search Results - "Dae-Gyu Park"
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Experimental Study of Gate-First FinFET Threshold-Voltage Mismatch
Published in IEEE transactions on electron devices (01-02-2014)“…In this brief, threshold voltage mismatch of fully integrated n-type FinFETs based on a gate-first process was studied experimentally. Significantly improved…”
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CMOS-Compatible Self-Aligned In0.53Ga0.47As MOSFETs With Gate Lengths Down to 30 nm
Published in IEEE transactions on electron devices (01-10-2014)“…We demonstrate self-aligned fully-depleted 20-nm-thick In 0.53 Ga 0.47 As-channel MOSFETs using CMOS-compatible device structures and manufacturable process…”
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3
Demonstration of record SiGe transconductance and short-channel current drive in High-Ge-Content SiGe PMOS FinFETs with improved junction and scaled EOT
Published in 2016 IEEE Symposium on VLSI Technology (01-06-2016)“…We demonstrate high-performance (HP) High-Ge-Content (HGC) SiGe pMOS FinFETs with scaled EOT and improved junction. For the first time, SiGe FinFET EOT scaling…”
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Conference Proceeding -
4
On the Device Design and Drive-Current Capability of SOI Lateral Bipolar Transistors
Published in IEEE journal of the Electron Devices Society (01-09-2014)“…The SOI symmetric lateral bipolar transistor is uniquely suitable for operation at high injection currents where the injected minority carrier density in the…”
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5
A Comparison of Short-Channel Control in Planar Bulk and Fully Depleted Devices
Published in IEEE electron device letters (01-06-2012)“…The short-channel effects (SCEs) of planar bulk and fully depleted finFET devices have been compared using the same junction overlap and lateral gradient, and…”
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High- \kappa/Metal-Gate Fully Depleted SOI CMOS With Single-Silicide Schottky Source/Drain With Sub-30-nm Gate Length
Published in IEEE electron device letters (01-04-2010)“…Schottky source/drain (S/D) MOSFETs hold the promise for low series resistance and extremely abrupt junctions, providing a path for device scaling in…”
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7
Effects of fluorine and chlorine on the gate oxide integrity of W/TiN/SiO2/Si metal-oxide-semiconductor structure
Published in Thin solid films (01-07-2005)“…We investigate the effects of fluorine (F) and chorine (Cl) on the gate oxide integrity of W/TiN/SiO2 (3 nm)/Si metal--oxide--semiconductor (MOS) structure as…”
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8
Work function and thermal stability of Ti1−xAlxNy for dual metal gate electrodes
Published in Applied physics letters (25-11-2002)“…Work function and thermal stability of reactive sputtered Ti1−xAlxNy films were investigated for a metal gate electrode using a metal–oxide–semiconductor (MOS)…”
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9
Impact of atomic-layer-deposited TiN on the gate oxide quality of W/TiN/SiO2/Si metal–oxide–semiconductor structures
Published in Applied physics letters (08-04-2002)“…We demonstrate the impact of atomic-layer-deposited TiN gate on the characteristics of W/TiN/SiO2/p-Si metal–oxide–semiconductor (MOS) systems. Damage-free…”
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10
Electrical and Structural Properties of Nanolaminate (Al 2 O 3 /ZrO 2 /Al 2 O 3 ) for Metal Oxide Semiconductor Gate Dielectric Applications
Published in Japanese Journal of Applied Physics (01-04-2002)“…Authors investigated electrical and material properties of an ultrathin nanolaminate (Al2O3/ZrO2/Al2O3) structure, prepared by atomic-layer CVD (ALCVD), for…”
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11
Pressure-sensitive adhesive composites with a hydrophobic form of graphene oxide for enhanced thermal conductivity
Published in Macromolecular research (01-12-2016)“…Pressure-sensitive adhesive (PSA) composites containing oleylamine functionalized graphene oxide (OA-f-GO) fillers were prepared. The effects of the surface…”
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Preparation and characterization of expanded graphite intercalation compound/UV-crosslinked acrylic resin pressure sensitive adhesives
Published in Macromolecular research (01-04-2015)“…The expanded graphite intercalated compound (xGIC)/pressure sensitive adhesives (PSAs) were prepared by syrup process and in situ process. The effects of xGIC…”
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Strained Si1−xGex-on-insulator PMOS FinFETs with excellent sub-threshold leakage, extremely-high short-channel performance and source injection velocity for 10nm node and beyond
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01-06-2014)“…We demonstrate high performance (HP) s-SiGe pMOS finFETs with I on /I eff of ~1.05/0.52mA/μm and ~1.3/0.71mA/μm at I off =100nA/μm at V DD =0.8 and 1V,…”
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Conference Proceeding -
14
Measurement and analysis of gate-induced drain leakage in short-channel strained silicon germanium-on-insulator pMOS FinFETs
Published in 72nd Device Research Conference (01-06-2014)“…Strained silicon germanium (s-SiGe) pMOS finFETs have proven benefits over silicon p-MOSFETs due to their superior transport properties which is attributed to…”
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Conference Proceeding -
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EFFECTS OF IRRADIATION ON THERMAL CONDUCTIVITY OF ALLOY 690 AT LOW NEUTRON FLUENCE
Published in Nuclear engineering and technology (01-04-2013)“…Alloy 690 has been selected as a steam generator tubing material for SMART owing to a near immunity to primary water stress corrosion cracking. The steam…”
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Polymerization of a Photochromic Diarylethene by Friedel−Crafts Alkylation
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17
Optimal supplementation of dexamethasone for clinical purposed expansion of mesenchymal stem cells for bone repair
Published in Journal of orthopaedic science : official journal of the Japanese Orthopaedic Association (01-09-2011)“…Although mesenchymal stem cells (MSCs) are generally considered to represent a very promising tool for bone repair, no optimal protocol has yet been developed…”
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18
Characteristics of Si3N4/Si/ n -GaAs metal-insulator-semiconductor interfaces grown on GaAs(111)B substrate
Published in Applied physics letters (11-11-1996)“…Interfacial properties of Al/Si3N4/Si/n-GaAs metal-insulator-semiconductor (MIS) capacitors grown on GaAs(111)B prepared with a combination of in situ…”
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19
Characteristics of Multiple Thickness Gate Oxides Using Oxidation Enhancement by Si Implantation
Published in Japanese Journal of Applied Physics (2003)“…The thickness of gate oxides grown on the Si-implanted (7 keV, 1 x 1015 cm-2) substrate (Si I/I oxide) increased to a constant amount of approximately 9…”
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20
Complementary thin-base symmetric lateral bipolar transistors on SOI
Published in 2011 International Electron Devices Meeting (01-12-2011)“…CMOS and bipolar technologies are intrinsically distinct. To take advantage of the beneficial attributes of both will drive expensive high mask count…”
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Conference Proceeding