Search Results - "DYCUS, J.H."

Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy by Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

“…Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via…”
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A reliable approach to prepare brittle semiconducting materials for cross‐sectional transmission electron microscopy by DYCUS, J.H., LEBEAU, J.M.

“…Summary Here, we present a sample preparation approach that simplifies the thinning of very brittle wide bandgap semiconducting materials in cross‐section…”
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Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy by Dycus, J.H., Xu, W., Sang, X., D'Alfonso, A.J., Chen, Z., Weyland, M., Allen, L.J., Findlay, S.D., LeBeau, J.M.

“…Here we report the influence of key experimental parameters on atomically resolved energy dispersive X-ray spectroscopy (EDX). In particular, we examine the…”
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Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy by Xu, W., Dycus, J.H., LeBeau, J.M.

“…•3D approach to model complex specimen shapes for EDS quantification when using multiple detectors.•Sample geometry can greatly impact the accuracy of EDS…”
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A numerical model for multiple detector energy dispersive X-ray spectroscopy in the transmission electron microscope by Xu, W., Dycus, J.H., Sang, X., LeBeau, J.M.

“…Here we report a numerical approach to model a four quadrant energy dispersive X-ray spectrometer in the transmission electron microscope. The model includes…”
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