Search Results - "DIJKKAMP, D"

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    Epitaxial ordering of oxide superconductor thin films on (100) SrTiO3 prepared by pulsed laser evaporation by WU, X. D, DIJKKAMP, D, OGALE, S. B, INAM, A, CHASE, E. W, MICELI, P. F, CHANG, C. C, TARASCON, J. M, VENKATESAN, T

    Published in Applied physics letters (14-09-1987)
    “…Thin films of Y-Ba-Cu-O superconductors on (100) SrTiO3 were prepared using the pulsed excimer laser evaporation technique. After an annealing treatment in…”
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    Journal Article
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    Direct writing in Si with a scanning tunneling microscope by van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J.

    Published in Applied physics letters (25-09-1989)
    “…Using the W tip of a scanning tunneling microscope, indentations with diameters of 2–10 nm have been made directly in Si (110) and Si (001) surfaces. It is…”
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    Journal Article
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    Scanning tunneling microscopy study of Si (001) and Si (110) surface structures resulting from different thermal cleaning treatments by Dijkkamp, D., van Loenen, E. J., Hoeven, A. J., Dieleman, J.

    “…We have studied the morphology and distribution of atomic steps on Si (001) and Si (110) with scanning tunneling microscopy. We find that native oxide removal…”
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    Journal Article Conference Proceeding
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    Island and step structures on molecular beam epitaxy grown Si(001) surfaces by Hoeven, A. J., Dijkkamp, D., van Loenen, E. J., Lenssinck, J. M., Dieleman, J.

    “…Initial stages of Si molecular beam epitaxy (MBE) on Si(001) substrates, misoriented 0.5° towards [110], were investigated using scanning tunneling microscopy…”
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    Morphology and distribution of atomic steps on Si(001) studied with scanning tunneling microscopy by DIJKKAMP, D, HOEVEN, A. J, VAN LOENEN, E. J, LENSSINCK, J. M, DIELEMAN, J

    Published in Applied physics letters (1990)
    “…We have studied the morphology and distribution of atomic steps on Si(001) with scanning tunneling microscopy. We find that native oxide removal at…”
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    Journal Article
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    Optical second‐harmonic generation study of barium deposition on Si(001) by Hollering, R. W. J., Dijkkamp, D., Lindelauf, H. W. L., van der Heide, P. A. M., Krijn, M. P. C. M.

    “…Experimental results are presented on the deposition of barium on clean Si(001) studied by optical second‐harmonic generation and work function measurements…”
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    Evidence for tip imaging in scanning tunneling microscopy by VAN LOENEN, E. J, DIJKKAMP, D, HOEVEN, A. J, LENSSINCK, J. M, DIELEMAN, J

    Published in Applied physics letters (30-04-1990)
    “…It is demonstrated that scanning tunneling microscopy (STM) images often contain three-dimensional ghost images of the tunneling tip. These ghost images…”
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    Nanometer scale structuring of silicon by direct indentation by van Loenen, E. J., Dijkkamp, D., Hoeven, A. J., Lenssinck, J. M., Dieleman, J.

    “…Shallow indentations with diameters of 2–10 nm have been made directly in clean Si(110) and Si(001) surfaces using the W tip of a scanning tunneling…”
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    Journal Article Conference Proceeding
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    High-voltage research and development at Philips Display Components by Joosse, K., Aarnink, W.A.M., Dijkkamp, D., Crombeen, J.E., Niessen, E.M.J.

    “…Robust high-voltage product designs and manufacturing processes are of vital importance in cathode ray tube production. Ever increasing demands on performance…”
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    Conference Proceeding
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    Scanning tunneling microscopy study of initial stages of silicon molecular beam epitaxy by Hoeven, A. J., Dijkkamp, D., Lenssinck, J. M., van Loenen, E. J.

    “…Initial stages of Si molecular beam epitaxy on vicinal Si(001) substrates were investigated using scanning tunneling microscopy. It was found that at…”
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    A model for Si molecular‐beam epitaxy based on scanning tunneling microscopy observations and computer simulations by Elswijk, H. B., Hoeven, A. J., van Loenen, E. J., Dijkkamp, D.

    “…Scanning tunneling microscopy observations of homoepitaxial growth on vicinal Si(001) and of coarsening of Si islands are used to develop a model of growth…”
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    Conference Proceeding