Search Results - "DECOSSAS, S"

Optimization of poly-di-methyl-siloxane (PDMS) substrates for studying cellular adhesion and motility by Fuard, D., Tzvetkova-Chevolleau, T., Decossas, S., Tracqui, P., Schiavone, P.

“…The cellular adhesion and motility have direct implications in the tumoral-metastatic cells development or in the tissue engineering mechanisms for instance…”
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Structural properties and surface morphology of laser-deposited amorphous carbon and carbon nitride films by Riedo, E., Comin, F., Chevrier, J., Schmithusen, F., Decossas, S., Sancrotti, M.

“…A study of the relationship between structure and growth parameters for existing and candidate carbon-based protective coatings has been carried out. In…”
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Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface by Decossas, S., Patrone, L., Bonnot, A.M., Comin, F., Derivaz, M., Barski, A., Chevrier, J.

“…We have investigated atomic force microscopy (AFM) induced displacement of carbon nanotubes (CNT) on a nanostructured surface. Evidence is given that nano-dots…”
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Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy by Decossas, S., Vitiello, J., Baron, T., Mazen, F., Gidon, S.

“…Ultrahigh vacuum atomic force microscopy has been used to inject and detect charges in individual silicon nanocrystals. The sensitivity of our measurements is…”
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Nanometer-scale mechanical properties probed by two-dimensional dynamic force spectroscopy with rigid cantilever by Brun, M., Decossas, S., Triozon, F., Rannou, R., Grévin, B.

“…We demonstrate that frequency-modulated atomic force microscopy with a rigid cantilever can be used to image the microphase separation of soft materials, i.e.,…”
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Electrical characterisation of local electronic properties of self-assembled semiconductor nanostructures using AFM by Decossas, S, Marchand, J.J, Brémond, G

“…Scanning capacitance microscopy (SCM) and Kelvin probe force microscopy (KPFM) have been used to characterise self-assembled Ge nanoislands embedded in…”
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Preferential nucleation of silicon nano-crystals on electron beam exposed SiO2 surfaces by MAZEN, F, MOLLARD, L, BARON, T, DECOSSAS, S, HARTMANN, J. M

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Batch processing of nanometer-scale electrical circuitry based on in-situ grown single-walled carbon nanotubes by Marty, L., Bouchiat, V., Bonnot, A.M., Chaumont, M., Fournier, T., Decossas, S., Roche, S.

“…We present a fabrication method for a nanometer-scale conducting network made of self-assembled single-walled carbon nanotubes. The electrical connection of…”
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Electric measurements by AFM on silicon nanocrystals by Decossas, S, Mazen, F, Baron, T, Souifi, A, Brémond, G

“…Scanning capacitance microscopy (SCM) has been used to characterize Silicon nanocrystals (Si-nc) embedded in Silicon oxide. Our experimental approach is based…”
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Preferential nucleation of silicon nano-crystals on electron beam exposed SiO2 surfaces by Mazen, F, Mollard, L, Baron, T, Decossas, S, Hartmann, J M

“…We propose a new method, based on a direct electron beam exposure of the SiO2 substrate surface, to create nucleation sites for silicon nano-crystals (Si-Ncs)…”
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Preferential nucleation of silicon nano-crystals on electron beam exposed SiO 2 surfaces by Mazen, F., Mollard, L., Baron, T., Decossas, S., Hartmann, J.M.

“…We propose a new method, based on a direct electron beam exposure of the SiO 2 substrate surface, to create nucleation sites for silicon nano-crystals (Si-Ncs)…”
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Electric measurements by AFM on silicon nano-crystals by Decossas, S., Mazen, F., Baron, T., Souifi, A., Brémond, G.

“…Scanning capacitance microscopy (SCM) has been used to characterize Silicon nanocrystals (Si-nc) embedded in Silicon oxide. Our experimental approach is based…”
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Bulk and surface evidence for the long-range spatial modulation of X-ray absorption in the Al-Pd-Mn quasicrystal at Bragg incidence by Chevrier, J, Dechelette, A, Schmithtisen, F, Decossas, S, Cappello, G, Comin, F, moso, V, De Boissieu, M, Jach, T, Colella, R

“…An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al-Pd-Mn quasicrystal with the X-ray beam at normal incidence. The…”
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Bulk and surface evidence for the long-range spatial modulation of X-ray absorption in the Al–Pd–Mn quasicrystal at Bragg incidence by Cappello, Giovanni, Dechelette, Aude, Schmithüsen, Frank, Decossas, Sebastien, Chevrier, Joël, Comin, Fabio, Formoso, Vincenzo, de Boissieu, Marc, Jach, Terrence, Colella, Roberto, Lograsso, T.A, Jenks, Cynthia, Delaney, Dwight

“…An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al–Pd–Mn quasicrystal with the X-ray beam at normal incidence. The…”
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