Search Results - "DE SCHEPPER, L"

Observation of the subgap optical absorption in polymer-fullerene blend solar cells by Goris, L., Poruba, A., Hod'ákova, L., Vaněček, M., Haenen, K., Nesládek, M., Wagner, P., Vanderzande, D., De Schepper, L., Manca, J. V.

“…This letter reports on highly sensitive optical absorption measurements on organic donor-acceptor solar cells, using Fourier-transform photocurrent…”
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Disclosure of the nanostructure of MDMO-PPV:PCBM bulk hetero-junction organic solar cells by a combination of SPM and TEM by Martens, T., D’Haen, J., Munters, T., Beelen, Z., Goris, L., Manca, J., D’Olieslaeger, M., Vanderzande, D., De Schepper, L., Andriessen, R.

“…The microstructure of MDMO-PPV:PCBM blends as used in bulk hetero-junction organic solar cells is studied by atomic force microscopy (AFM) to image the surface…”
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Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy by Goris, L., Haenen, K., Nesládek, M., Wagner, P., Vanderzande, D., De Schepper, L., D’haen, J., Lutsen, L., Manca, J. V.

“…A high sensitive approach is presented to detect in particular the low level absorption features in pure and blended organic semiconductor films, revealing…”
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A Charge-to-Breakdown (QBD) Approach to SiC Gate Oxide Lifetime Extraction and Modeling by Moens, P., Franchi, J., Lettens, J., Schepper, L. De, Domeij, M., Allerstam, F.

“…This paper proposes a charge-to-breakdown (Q BD ) approach for SiC/SiO 2 dielectric lifetime extraction. The current through the dielectric is shown to be a…”
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The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensors by Esch, H, Huyberechts, G, Mertens, R, Maes, G, Manca, J, De Ceuninck, W, De Schepper, L

“…Good performance of alarm systems and environmental as well as industrial control methods requires an optimal operation of the gas sensors involved. An…”
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Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress by Avramenko, M., De Schepper, L., Cano, J.-F., Geenen, F., Moens, P., Marcuzzi, A., De Santi, C., Meneghini, M.

“…This paper introduces a novel three-dimensional approach to model threshold voltage variation (\mathbf{\Delta} \boldsymbol{V}_{\boldsymbol{th}}) during…”
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The phosphorous level fine structure in homoepitaxial and polycrystalline n-type CVD diamond by Haenen, K., Nesládek, M., De Schepper, L., Kravets, R., Vaněček, M., Koizumi, S.

“…The application of very sensitive photocurrent-based spectroscopic techniques have led to the detection of new levels for the electronic structure of the…”
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Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements by Aresu, S., De Ceuninck, W., Degraeve, R., Kaczer, B., Knuyt, G., Schepper, L. De

“…A model is proposed and validated for the degradation mechanisms occurring in ultra-thin SiO2 at real operation conditions, based on high-resolution,…”
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A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation by Dreesen, R., Croes, K., Manca, J., De Ceuninck, W., De Schepper, L., Pergoot, A., Groeseneken, G.

“…The hot-carrier degradation of lightly doped drain nMOSFETs is studied in detail. The degradation proceeds in a two-stage mechanism, involving first a series…”
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Statistical aspects of the degradation of LDD nMOSFETs by Andries, E., Dreesen, R., Croes, K., De Ceuninck, W., De Schepper, L., Groeseneken, G., Lo, K.F., D’Olieslaeger, M., D’Haen, J.

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A comparison between state-of-the-art ‘gilch’ and ‘sulphinyl’ synthesised MDMO-PPV/PCBM bulk hetero-junction solar cells by Munters, T., Martens, T., Goris, L., Vrindts, V., Manca, J., Lutsen, L., De Ceuninck, W., Vanderzande, D., De Schepper, L., Gelan, J., Sariciftci, N.S., Brabec, C.J.

“…To obtain photovoltaic devices based on electron donating conjugated polymers with a higher efficiency, a major breakthrough was realised by mixing the…”
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Reversible Switching of the Surface Conductance of Hydrogenated CVD Diamond Films by Cannaerts, M., Nesladek, M., Haenen, K., Stals, L.M., De Schepper, L., Van Haesendonck, C.

“…Chemical vapor deposited (CVD) diamond films have a controversial history regarding their surface electronic properties. Hydrogenation is known to induce a…”
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Spatial distribution of interface traps in DeMOS transistors by Moens, P., Vlachakis, B., Bauwens, F., De Schepper, L.

“…The spatial distribution of interface traps in a p-type drain extended MOS transistor is experimentally determined by the analysis of variable base-level…”
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Nanostructured organic pn junctions towards 3D photovoltaics by MARTENS, T, MUNTERS, T, DE SCHEPPER, L, MANCA, J. V, GORIS, L, D'HAEN, J, SCHOUTEDEN, K, D'OLIESLAEGER, M, LUTSEN, L, VANDERZANDE, D, GEENS, W, POORTMANS, J

“…The working principle of so-called organic bulk heterojunction solar cells prepared with blends of poly(2-methoxy-5-(3',7'-dimethyl-octyloxy))-p-phenylene…”
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Poly(5,6-dithiooctylisothianaphtene), a new low band gap polymer: spectroscopy and solar cell construction by Goris, L., Loi, M.A., Cravino, A., Neugebauer, H., Sariciftci, N.S., Polec, I., Lutsen, L., Andries, E., Manca, J., De Schepper, L., Vanderzande, D.

“…To enhance the efficiency of polymer photovoltaics, much effort is put into synthesis of novel compounds which show a better harvesting of solar light. In this…”
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Influence of annealing on the electronic properties of chemical vapor deposited diamond films studied by high vacuum scanning tunneling microscopy and spectroscopy by Cannaerts, M, Nesladek, M, Haenen, K, De Schepper, L, Stals, L.M, Van Haesendonck, C

“…Scanning tunneling spectroscopy (STS) under high vacuum conditions (2×10 −8 mbar), combined with high-resolution topographical imaging with the scanning…”
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Investigation of the formation process of MCs +-molecular ions during sputtering by Vlekken, Johan, D’Olieslaeger, Marc, Knuyt, Gilbert, Vandervorst, Wilfried, De Schepper, Luc

“…In secondary ion mass spectrometry, the detection of MCs + clusters (with M an element of the specimen) under a Cs + bombardment is frequently used for the…”
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MIMC reliability and electrical behavior defined by a physical layer property of the dielectric by Ackaert, J., Charavel, R., Dhondt, K., Vlachakis, B., De Schepper, L., Millecam, M., Vandevelde, E., Bogaert, P., Iline, A., De Backer, E., Vlad, A., Raskin, J.-P.

“…Metal–insulator–metal capacitor (MIMC) reliability and electrical properties are defined by the TDDB lifetime, breakdown voltage and leakage current. In this…”
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Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation by Petersen, R., De Ceuninck, W., De Schepper, L., Vendier, O., Blanck, H., Pons, D.

“…The reliability of Heterojunction Bipolar Transistors (HBT's) depends on parameters such as junction temperature and current density. For the description of…”
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Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology by Petersen, R., De Ceuninck, W., D’Haen, J., D’Olieslager, M., De Schepper, L., Vendier, O., Blanck, H., Pons, D.

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