Search Results - "D’yachkova, I. G."

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  1. 1

    X-Ray Diagnostics of Microstructure Defects of Silicon Crystals Irradiated by Hydrogen Ions by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Krivonosov, Yu. S., Chukhovskii, F. N.

    Published in Technical physics (01-05-2019)
    “…Features of formation and transformation of radiation defects in near-surface layers of silicon plates that are implanted with hydrogen ions are studied. Using…”
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    Journal Article
  2. 2

    X-ray study of the structure of phospholipid monolayers on the water surface by Asadchikov, V. E., Tikhonov, A. M., Volkov, Yu. O., Roshchin, B. S., Ermakov, Yu. A., Rudakova, E. B., D’yachkova, I. G., Nuzhdin, A. D.

    Published in JETP letters (01-10-2017)
    “…The possibility of laboratory X-ray reflectometry study of the structure of dimyristoyl phosphatidylserine (DMPS) phospholipid monolayers on the water surface…”
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    Journal Article
  3. 3

    On Change in the Silicon Crystal Structure Implanted with Hydrogen Ions during Annealing Based on Three-Crystal X-Ray Diffractometry Data by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Chukhovskii, F. N., Sorokin, L. M.

    Published in Physics of the solid state (01-08-2019)
    “…In this paper, we present the results of a three-crystal X-ray diffractometry (XRD) study of the state of a disturbed layer formed in silicon crystals by…”
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    Journal Article
  4. 4

    Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Chukhovskii, F. N., Sorokin, L. M.

    Published in Physics of the solid state (01-10-2019)
    “…The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New…”
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    Journal Article
  5. 5

    X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal by Zolotov, D. A., Asadchikov, V. E., Buzmakov, A. V., D’yachkova, I. G., Krivonosov, Yu. S., Chukhovskii, F. N., Suvorov, E. V.

    “…This paper is a continuation of previous studies on the development of X-ray topo-tomography using laboratory equipment. The results on the spatial location of…”
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    Journal Article
  6. 6

    Microstructure of Si Crystals Subjected to Irradiation with High-Energy H.sup.+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy by Asadchikov, V. E, D'yachkova, I. G, Zolotov, D. A, Chukhovskii, F. N, Sorokin, L. M

    Published in Physics of the solid state (01-10-2019)
    “…The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New…”
    Get full text
    Journal Article
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