Search Results - "Czeppel, L T"

A study on the short- and long-term effects of X-ray exposure on NAND Flash memories by Gerardin, S, Bagatin, M, Paccagnella, A, Visconti, A, Beltrami, S, Bertuccio, M, Czeppel, L T

“…We investigate the effects of X-ray exposure in 41-nm single level NAND Flash memories at small doses, comparable to those used in printed circuit board…”
Get full text

Effects of Total Ionizing Dose on the Retention of 41-nm NAND Flash Cells by Bagatin, M., Gerardin, S., Paccagnella, A., Visconti, A., Beltrami, S., Bertuccio, M., Czeppel, L. T.

“…Flash memories operating in space are subject at the same time to the progressive accumulation of total ionizing dose and to intrinsic aging phenomena. In this…”
Get full text