Search Results - "Cumpson, Peter J"

Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles by Neagu, Dragos, Papaioannou, Evangelos I., Ramli, Wan K. W., Miller, David N., Murdoch, Billy J., Ménard, Hervé, Umar, Ahmed, Barlow, Anders J., Cumpson, Peter J., Irvine, John T. S., Metcalfe, Ian S.

“…Metal nanoparticles prepared by exsolution at the surface of perovskite oxides have been recently shown to enable new dimensions in catalysis and energy…”
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Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications by Cumpson, Peter J., Portoles, Jose F., Barlow, Anders J., Sano, Naoko, Birch, Mark

“…Argon gas cluster ion beam sources are likely to become much more widely available on XPS and SIMS instruments in the next few years. Much attention has been…”
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Practical estimation of XPS binding energies using widely available quantum chemistry software by Tardio, Sabrina, Cumpson, Peter J.

“…Chemical shifts observed in high‐resolution X‐ray photoelectron spectroscopy (XPS) spectra are normally used to determine the chemical state of the elements of…”
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Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers by Cumpson, Peter J., Portoles, Jose F., Sano, Naoko

“…Traditionally polymer depth profiling by X‐ray photoelectron spectroscopy (XPS) has been dominated by the damage introduced by the ion beam rather than the…”
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Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships by Cumpson, Peter J.

“…Inelastic mean free path values are needed for quantitative XPS analysis of a range of important polymers and other organic materials. Measured reference data…”
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The Thickogram: a method for easy film thickness measurement in XPS by Cumpson, Peter J

“…We describe a simple graphical method for measuring film thickness by XPS, which we call a Thickogram. This method can be used even when the film and substrate…”
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Argon cluster‐ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield by Cumpson, Peter J., Jaskiewicz, Mieszko, Kim, Woo Kyun

“…Argon Gas Cluster‐Ion Beam sources have become widely‐used on X‐ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) instruments in…”
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Surface analysis characterisation of gum binders used in modern watercolour paints by Sano, Naoko, Cumpson, Peter J.

“…•XPS demonstrated the characterisation of top surface structures of the watercolours.•Water medium in the paint transforms structures and forms gum layer on…”
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Novel rhodium on carbon catalysts for the oxidation of benzyl alcohol to benzaldehyde: A study of the modification of metal/support interactions by acid pre-treatments by Wilde, Conor A., Ryabenkova, Yulia, Firth, Ian M., Pratt, Liam, Railton, James, Bravo-Sanchez, Mariela, Sano, Naoko, Cumpson, Peter J., Coates, Phil D., Liu, Xi, Conte, Marco

“…[Display omitted] •Rh on carbon catalysts were capable to oxidize benzyl alcohol under very mild conditions.•Carbon supports pre-treated with HNO3 led to…”
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Conversion of glucose to fructose over Sn and Ga-doped zeolite Y in methanol and water media by Kashbor, Mohamed M.M., Sutarma, Dedi, Railton, James, Sano, Naoko, Cumpson, Peter J., Gianolio, Diego, Cibin, Giannantonio, Forster, Luke, D’Agostino, Carmine, Liu, Xi, Chen, Liwei, Degirmenci, Volkan, Conte, Marco

“…In this study, we use zeolite Y as a support for the synthesis of Sn and Ga doped zeolites aimed at the isomerization of glucose to fructose. Though these…”
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Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis by Cumpson, Peter J, Fletcher, Ian W, Sano, Naoko, Barlow, Anders J

“…Principal component analysis (PCA) and other multivariate analysis methods have been used increasingly to analyse and understand depth‐profiles in XPS, AES and…”
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Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers by Cumpson, Peter J., Portoles, Jose F., Sano, Naoko

“…There is a pressing need for reference data to allow sputter depth-profiling of polymers using cluster and polyatomic ion sources for the quantification of…”
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Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method by Cumpson, Peter J., Sano, Naoko, Fletcher, Ian W., Portoles, Jose F., Bravo-Sanchez, Mariela, Barlow, Anders J.

“…Principal component analysis (PCA) and other multivariate analysis methods have been used increasingly to analyse and understand depth profiles in X‐ray…”
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Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface by Sano, Naoko, Barlow, Anders J., Tsakonas, Costas, Cranton, Wayne, Cumpson, Peter J.

“…We have observed for the first time a subtle chemical change in the oxidation state of Zn at the interface between a ZnO thin film and a glass substrate using…”
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Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards: Quantifying mercury and carbon contamination on platinum-iridium alloy surfaces using XPS by Cumpson, Peter J.

“…We review developments in the study of the stability of platinum-iridium standard weights, in particular the kilogram prototypes manufactured from alloy…”
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Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging by Barlow, Anders J., Scott, Oliver, Sano, Naoko, Cumpson, Peter J.

“…The clear identification of allotropes and similar chemical states of carbon in XPS imaging can be made difficult because of the subtle differences observed in…”
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Reactive intercalation and oxidation at the buried graphene-germanium interface by Braeuninger-Weimer, Philipp, Burton, Oliver, Weatherup, Robert S., Wang, Ruizhi, Dudin, Pavel, Brennan, Barry, Pollard, Andrew J., Bayer, Bernhard C., Veigang-Radulescu, Vlad P., Meyer, Jannik C., Murdoch, Billy J., Cumpson, Peter J., Hofmann, Stephan

“…We explore a number of different electrochemical, wet chemical, and gas phase approaches to study intercalation and oxidation at the buried graphene-Ge…”
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Multispectral optical imaging combined in situ with XPS or ToFSIMS and principal component analysis by Cumpson, Peter J., Fletcher, Ian W., Burnett, Richard, Sano, Naoko, Barlow, Anders J., Portoles, Jose F., Li, Lisa W., Kiang, Andrew Shih-Hsiung

“…All X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) instruments have optical cameras to image the specimen…”
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Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments by Sano, Naoko, Cumpson, Peter J., Cwiertnia, Elke, Perry, Justin J., Singer, Brian W.

“…This work demonstrates the potential of surface analysis techniques to contribute to a better understanding for art conservators of the degradation of modern…”
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In situ ion beam sputter deposition and X‐ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis by Wilson, Thomas A., Barlow, Anders J., Foster, Michael L., Bravo Sanchez, Mariela, Portoles, Jose F., Sano, Naoko, Cumpson, Peter J., Fletcher, Ian W.

“…Deposition of ultra‐thin layers under computer control is a frequent requirement in studies of novel sensors, materials screening, heterogeneous catalysis, the…”
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