Search Results - "Cumpson, P."

Computer-readable Image Markers for Automated Registration in Correlative Microscopy – “autoCRIM” by Sheriff, J., Fletcher, I.W., Cumpson, P.J.

“…•Correlative Microscopy using surface analysis techniques•3-Dimentional data representation of a surface at the nanoscale•Correlative Microscopy using SIMS,…”
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The plasmonic properties of argon cluster-bombarded InP surfaces by Murdoch, B. J., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

“…Gas cluster ion beam sputtering has been used to study the self-organising behaviour of In metallic nanoparticles produced by preferential sputtering of…”
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Antimicrobial properties of Cu-based bulk metallic glass composites after surface modification by Villapún, Victor M., Tardío, S., Cumpson, P., Burgess, J.G., Dover, L.G., González, S.

“…The aim of this work is to study the influence of two surface modification methods, surface grinding to change the surface roughness (from 240 to 4000 grit)…”
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Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection by Murdoch, B. J., Portoles, J. F., Tardio, S., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

“…Visible wavelength surface-enhanced Raman spectroscopy (SERS) has been observed from bovine serum albumin (BSA) using In-InP nanopillars synthesised by Ar gas…”
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Elastic Scattering Corrections in AES and XPS. II. Estimating Attenuation Lengths and Conditions Required for their Valid Use in Overlayer/Substrate Experiments by Cumpson, P. J., Seah, M. P.

“…We examine substrate/overlayer experiments and the equations commonly used to quantify overlayer thicknesses. Comparisons with accurate Monte‐Carlo simulations…”
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Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography by Roy, Debdulal, Munz, Martin, Colombi, Paolo, Bhattacharyya, Sanjib, Salvetat, Jean-Paul, Cumpson, P.J., Saboungi, Marie-Louise

“…Well-defined nanostructures were written with quantum dots and magnetic nanoparticles on gold and mica surfaces using dip-pen nanolithography at room…”
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Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs by Cumpson, Peter J., Zhdan, Peter, Hedley, John

“…Calibration of the spring constant of atomic force microscope (AFM) cantilevers is necessary for the measurement of nanonewton and piconewton forces, which are…”
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Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support by Munz, M., Cox, D. C., Cumpson, P. J.

“…Using atomic force microscopy (AFM/SFM), the strength of the adhesion between nanoparticles (NPs) and a flat gold surface was studied. By scanning in contact…”
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Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships by Cumpson, Peter J.

“…Inelastic mean free path values are needed for quantitative XPS analysis of a range of important polymers and other organic materials. Measured reference data…”
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The Thickogram: a method for easy film thickness measurement in XPS by Cumpson, Peter J

“…We describe a simple graphical method for measuring film thickness by XPS, which we call a Thickogram. This method can be used even when the film and substrate…”
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Report on the 47th IUVSTA Workshop 'Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films' by Herrera-Gomez, A., Grant, J. T., Cumpson, P. J., Jenko, M., Aguirre-Tostado, F. S., Brundle, C. R., Conard, T., Conti, G., Fadley, C. S., Fulghum, J., Kobayashi, K., Kövér, L., Nohira, H., Opila, R. L., Oswald, S., Paynter, R. W., Wallace, R. M., Werner, W. S. M., Wolstenholme, J.

“…A summary of the workshop entitled ‘Angle‐Resolved XPS: The Current Status and Future Prospects for Angle‐resolved XPS of Nano and Subnano Films’ is given,…”
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Elastic Scattering Corrections in AES and XPS. III. Behaviour of Electron Transport Mean Free Path in Solids for Kinetic Energies in the Range 100 eV<E<400 eV by Cumpson, P. J.

“…Quantitative Auger electron spectroscopy (AES) and x‐ray photoelectron spectroscopy (XPS) depend on an accurate knowledge of the correct depth scale of…”
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Angle-resolved XPS depth-profiling strategies by Cumpson, Peter J

“…Angle-resolved X-ray photoelectron spectroscopy (ARXPS) can be used non-destructively to find the depth-distribution of chemical species. Although the…”
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Cones formed during sputtering of InP and their use in defining AFM tip shapes by Seah, M.P, Spencer, S.J, Cumpson, P.J, Johnstone, J.E

“…Small structures, formed on InP surfaces during sputtering, cause loss of depth resolution in sputter-depth profiles but may be conveniently incorporated into…”
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Sputter-induced cone and filament formation on InP and AFM tip shape determination by Seah, M. P., Spencer, S. J., Cumpson, P. J., Johnstone, J. E.

“…The structures formed on the InP(100) surface by sputtering with fluences of the order of 1021 ions m−2 of 4–8 keV argon are analysed by scanning electron…”
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Erratum: “Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection” [Appl. Phys. Lett. 109, 253105 (2016)] by Murdoch, B. J., Portoles, J. F., Tardio, S., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

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Angle-resolved XPS characterization of urea formaldehyde-epoxy systems by Perruchot, Christian, Watts, John F., Lowe, Chris, White, Richard G., Cumpson, Peter J.

“…A series a coil coating primers, based on high‐molecular‐weight epoxy resins and a urea formaldehyde crosslinking agent, have been investigated by…”
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Monte Carlo Calculations of The Depth Distribution Function in Multilayered Structures by Jackson, A. R., El Gomati, M. M., Matthew, J. A. D., Cumpson, P. J.

“…The statistical‐weights Monte Carlo program of Cumpson for the calculation of depth distribution functions (DDF) has been extended in order to allow faster…”
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Simple procedure for precise peak maximum estimation for energy calibration in AES and XPS by CUMPSON, P. J, SEAH, M. P, SPENCER, S. J

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Computer-readable Image Markers for Automated Registration in Correlative Microscopy autoCRIM by Sheriff, J, Fletcher, I. W, Cumpson, P. J

“…We present a newly developed methodology using computer-readable fiducial markers to allow images from multiple imaging modalities to be registered…”
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