Search Results - "Cross, Julie Olmsted"
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1
Structure of Cathodically Deposited Nickel Hexacyanoferrate Thin Films Using XRD and EXAFS
Published in Langmuir (01-10-2002)“…X-ray diffraction (XRD) and extended X-ray absorption fine structure (EXAFS) data were used to explore the structure of cathodically deposited thin films of…”
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Journal Article -
2
Analysis of diffraction anomalous fine structure
Published 01-01-1996“…This thesis presents a systematic study of the application of DAFS to determine site-specific local structural and chemical information in complex materials,…”
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Dissertation