Search Results - "Coyle, R.J."
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1
The effect of modifications to the nickel/gold surface finish on assembly quality and attachment reliability of a plastic ball grid array (peer review version)
Published in IEEE transactions on components and packaging technologies (01-12-2003)“…Electrolytic and electroless Ni/Au are common pad surface finishes on area array (BGA or CSP) packages and printed wiring boards (PWB). The electroless…”
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Journal Article -
2
Solder metallization interdiffusion in microelectronic interconnects
Published in IEEE transactions on components and packaging technologies (01-06-2000)“…We investigated the growth of intermetallic compounds in Cu/Ni/Au/PbSn solder joints. The substrates that we investigated had been Au plated by one of two…”
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Journal Article -
3
The effect of variations in nickel/gold surface finish on the assembly quality and attachment reliability of a plastic ball grid array
Published in 2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220) (2001)“…Electrolytic and electroless Ni/Au are common pad surface finishes on area array (BGA or CSP) packages and printed wiring boards (PWB). The electroless…”
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Conference Proceeding -
4
Solder joint attachment reliability and assembly quality of a molded ball grid array socket
Published in 2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220) (2001)“…This paper summarizes efforts to improve the assembly quality and solder joint reliability of a molded, plastic ball grid array socket. Metallographic analysis…”
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Conference Proceeding -
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Shear testing and failure mode analysis for evaluation of BGA ball attachment
Published in Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330) (1999)“…With increasing focus on BGA technology as a high performance package, there is an urgent need to develop industry-wide standards for package quality and…”
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Conference Proceeding -
6
Delivery of high power laser beams in a distributed materials processing system
Published in Conference Proceedings. LEOS'98. 11th Annual Meeting. IEEE Lasers and Electro-Optics Society 1998 Annual Meeting (Cat. No.98CH36243) (1998)“…An extensive multi-year experimental study of the delivery of high power laser beams through long step index plastic clad silica fibers was completed. The…”
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Conference Proceeding -
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The influence of test parameters and package design features on ball shear test requirements
Published in Twenty Sixth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.00CH37146) (2000)“…Ball shear testing is the most common test method used to assess solder ball attachment quality on area array packages. New package designs have a range of…”
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Conference Proceeding -
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The influence of room temperature aging on ball shear strength and microstructure of area array solder balls
Published in 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) (2000)“…Solder ball shear strength is determined for ball grid array (BGA) packages in the as-received condition and after solder reflow preconditioning (exposure to…”
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Conference Proceeding -
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Ball shear versus ball pull test methods for evaluating interfacial failures in area array packages
Published in 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium (2002)“…In this investigation, a ball pull (tensile) test is investigated as an alternative to the ball shear test for evaluating the solder joint integrity of area…”
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Conference Proceeding -
10
Electrostatic discharge (ESD) mechanism for battery charge contact failure in cordless phones
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) (1999)“…A comparison of the SEM EDX spectra for the metal charge contacts from field-returned cordless phones and for laboratory samples of fixed gap discharge (FGD)…”
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Conference Proceeding -
11
The influence of nickel/gold surface finish on the assembly quality and long term reliability of thermally enhanced BGA packages
Published in Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330) (1999)“…Increasing numbers of chip carrier packages such as BGA and CSP use electroless nickel/immersion gold (ENi/IAu) surface finishes. However, the results of…”
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Conference Proceeding -
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Assembly and reliability of thermally enhanced high I/O BGA packages
Published in Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium (1997)“…Surface mount assembly defects for thermally enhanced high I/O, BGAs can range from 0 to 20 ppmj with packages that meet the JEDEC coplanarity specification of…”
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Conference Proceeding -
13
Reliability performance and failure mode of high I/O thermally enhanced ball grid array packages
Published in Twenty Third IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.98CH36205) (1998)“…Thermally enhanced BGA packages can be susceptible to early failures during accelerated thermal cycling. These failures are attributed to a brittle fracture…”
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Conference Proceeding -
14
Stability of welding techniques used in single-mode laser packages
Published in 38th Electronics Components Conference 1988., Proceedings (1988)“…Critical alignments of single-mode laser packages have been secured using laser welds and resistance welds. Two methods were used to ascertain submicron…”
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Conference Proceeding -
15
Laser weld process improvements for optical isolator assembly
Published in 1995 Proceedings. 45th Electronic Components and Technology Conference (1995)“…Optical isolators are used in lightwave systems to reduce feedback that could be propagated in the signal fiber. Several methods can be used to assemble and…”
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Conference Proceeding Journal Article