Search Results - "Cooke, Mike"

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  1. 1

    Characterization of Ru4-xTax (x = 1,2,3) alloy as material candidate for EUV low-n mask by Wu, Meiyi, de Marneffe, Jean-François, Opsomer, Karl, Detavernier, Christophe, Delabie, Annelies, Naujok, Philipp, Caner, Özge, Goodyear, Andy, Cooke, Mike, Saadeh, Qais, Soltwisch, Victor, Scholze, Frank, Philipsen, Vicky

    Published in Micro and Nano Engineering (01-08-2021)
    “…Ru4-xTax (x = 1,2,3) alloys are studied as absorber candidates for EUV low-n mask. We report the morphology, surface roughness as well as the chemical…”
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    Journal Article
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    Dispersion of silicone oil in water surfactant solution: Effect of impeller speed, oil viscosity and addition point on drop size distribution by EL-Hamouz, Amer, Cooke, Mike, Kowalski, Adam, Sharratt, Paul

    Published in Chemical engineering and processing (01-02-2009)
    “…The preparation of dilute aqueous silicone oil emulsions has been investigated with particular attention to the effect of oil viscosity (0.49–350 mPa s),…”
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    Journal Article
  3. 3

    Modelling the oxidation of seventeen volatile organic compounds to track yields of CO and CO2 by GRANT, Aoife, ARCHIBALD, Alexander T, COOKE, Mike C, SHALLCROSS, Dudley E

    Published in Atmospheric environment (1994) (01-10-2010)
    “…A box model simulating tropospheric conditions was used to trace the oxidation pathways of 17 volatile organic compounds (VOCs) covering saturated, olefinic,…”
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    Journal Article
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    Advantages of the hollow (concave) turbine for multi-phase agitation under intense operating conditions by Cooke, Mike, Heggs, Peter J.

    Published in Chemical engineering science (01-10-2005)
    “…The mixing literature on hollow blade turbines (HBTS), for operation in fully turbulent flow, is reviewed and compared with the results of our own studies. The…”
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    Journal Article
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    Atomic layer etching in close-to-conventional plasma etch tools by Goodyear, Andy, Cooke, Mike

    “…Atomic layer etching using plasma is a cyclical etching process of gas dosing and surface bombardment that removes material layer by layer, and has the…”
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    Journal Article
  7. 7

    Viewpoint: 'Is technological change threatening the very existence of "traditional" survey research and, if so, what should we do about it?' by Cooke, Mike

    Published in International journal of market research (21-04-2017)
    “…In this viewpoint, the author explores the impact of technology on "traditional" survey research and whether technological change threatens the research's…”
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    Journal Article
  8. 8

    Web 2.0, Social Networks and the Future of Market Research by Cooke, Mike, Buckley, Nick

    Published in International journal of market research (01-01-2008)
    “…The paper identifies a number of trends that may well provide fertile ground for marketing researchers to develop new approaches. The open source movement will…”
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    Journal Article
  9. 9

    Inverted hollow spinning cone as a device for controlling foam and hold-up in pilot scale gassed agitated fermentation vessels by Stocks, Stuart M., Cooke, Mike, Heggs, Peter J.

    Published in Chemical engineering science (01-04-2005)
    “…The effectiveness of an inverted hollow spinning cone (IHSC) for controlling foam and liquid hold-up is demonstrated in pilot scale equipment for a currently…”
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    Journal Article Conference Proceeding
  10. 10

    Atomic layer etching of SiO2 with Ar and CHF 3 plasmas: A self‐limiting process for aspect ratio independent etching by Dallorto, Stefano, Goodyear, Andy, Cooke, Mike, Szornel, Julia E., Ward, Craig, Kastl, Christoph, Schwartzberg, Adam, Rangelow, Ivo W., Cabrini, Stefano

    Published in Plasma processes and polymers (01-09-2019)
    “…With ever increasing demands on device patterning to achieve smaller critical dimensions, the need for precise, controllable atomic layer etching (ALE) is…”
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    Journal Article
  11. 11

    Atomic layer etching of SiO2 with Ar and CHF3 plasmas: A self‐limiting process for aspect ratio independent etching by Dallorto, Stefano, Goodyear, Andy, Cooke, Mike, Szornel, Julia E, Ward, Craig, Kastl, Christoph, Schwartzberg, Adam, Rangelow, Ivo W, Cabrini, Stefano

    Published in Plasma processes and polymers (01-09-2019)
    “…With ever increasing demands on device patterning to achieve smaller critical dimensions, the need for precise, controllable atomic layer etching (ALE) is…”
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    Journal Article
  12. 12

    Specific features of power characteristics of in-line rotor–stator mixers by Jasińska, Magdalena, Bałdyga, Jerzy, Cooke, Mike, Kowalski, Adam J.

    Published in Chemical engineering and processing (01-05-2015)
    “…•High-shear rotor–stator mixers generate locally very high shear stresses due to focused delivery of energy.•Only energy dissipated in high shear regions is…”
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    Journal Article
  13. 13

    The effect of scale and interfacial tension on liquid–liquid dispersion in in-line Silverson rotor–stator mixers by Hall, Steven, Pacek, Andrzej W., Kowalski, Adam J., Cooke, Mike, Rothman, David

    Published in Chemical engineering research & design (01-11-2013)
    “…•Three scales of in-line Silverson rotor–stator mixer have been investigated.•Power draw and emulsion drop size distributions were measured…”
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    Journal Article
  14. 14

    Social media and market research: we are becoming a listening economy and, while the future of market research is bright, it will be different by Cooke, Mike

    Published in International journal of market research (01-07-2009)
    “…The WARC Online Conference held in London in early March was dominated by the rise of social media and the impact it is having on market research. It was clear…”
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    Journal Article
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    Atomic layer etching of SiO 2 with Ar and CHF 3 plasmas: A self‐limiting process for aspect ratio independent etching by Dallorto, Stefano, Goodyear, Andy, Cooke, Mike, Szornel, Julia E., Ward, Craig, Kastl, Christoph, Schwartzberg, Adam, Rangelow, Ivo W., Cabrini, Stefano

    Published in Plasma processes and polymers (01-09-2019)
    “…With ever increasing demands on device patterning to achieve smaller critical dimensions, the need for precise, controllable atomic layer etching (ALE) is…”
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    Journal Article
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    Towards closed loop control of a plasma tool using OES by Goodyear, Andrew, Cooke, Mike

    Published in Microelectronic engineering (01-04-2009)
    “…Potential candidate methods for closed loop control using OES have been evaluated for SF 6 etching of Si and for fluorocarbon etching of SiO 2. In the case of…”
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    Journal Article Conference Proceeding
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    Nanoparticle and nanosphere mask for etching of ITO nanostructures and their reflection properties by Xu, Cigang, Deng, Ligang, Holder, Adam, Bailey, Louise R., Leendertz, Caspar, Bergmann, Joachim, Proudfoot, Gary, Thomas, Owain, Gunn, Robert, Cooke, Mike

    “…Au nanoparticles and polystyrene nanospheres were used as mask for plasma etching of indium tin oxide (ITO) layer. By reactive ion etching (RIE) processes, the…”
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    Journal Article