Search Results - "Compagnoni, Christian Monzio"

Reviewing the Evolution of the NAND Flash Technology by Monzio Compagnoni, Christian, Goda, Akira, Spinelli, Alessandro S., Feeley, Peter, Lacaita, Andrea L., Visconti, Angelo

“…This paper reviews the recent historical trends of the NAND Flash technology, highlighting the evolution of its main parameters and explaining what allowed it…”
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Reliability of NAND Flash Arrays: A Review of What the 2-D-to-3-D Transition Meant by Monzio Compagnoni, Christian, Spinelli, Alessandro S.

“…This paper reviews what changed in the reliability of NAND Flash memory arrays after the paradigm shift in technology evolution determined by the transition…”
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Memristive and CMOS Devices for Neuromorphic Computing by Milo, Valerio, Malavena, Gerardo, Monzio Compagnoni, Christian, Ielmini, Daniele

“…Neuromorphic computing has emerged as one of the most promising paradigms to overcome the limitations of von Neumann architecture of conventional digital…”
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Unsupervised Learning by Spike-Timing-Dependent Plasticity in a Mainstream NOR Flash Memory Array-Part I: Cell Operation by Malavena, Gerardo, Filippi, Matteo, Spinelli, Alessandro S., Monzio Compagnoni, Christian

“…This article and its part II demonstrate the possibility to operate a mainstream NOR Flash memory array as an artificial synaptic array learning without…”
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Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays-Part I: Polysilicon-Induced Variability by Resnati, Davide, Mannara, Aurelio, Nicosia, Gianluca, Paolucci, Giovanni M., Tessariol, Paolo, Spinelli, Alessandro S., Lacaita, Andrea L., Monzio Compagnoni, Christian

“…This paper presents characterization and modeling results exploring the temperature dependence of the electrical characteristics of 3-D NAND Flash strings…”
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Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays by Malavena, Gerardo, Giulianini, Mattia, Chiavarone, Luca, Spinelli, Alessandro S., Monzio Compagnoni, Christian

“…In this letter, we present clear experimental evidence proving that a high-temperature idle/data-retention phase gives rise to a permanent intensification of…”
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Unsupervised Learning by Spike-Timing- Dependent Plasticity in a Mainstream NOR Flash Memory Array-Part II: Array Learning by Malavena, Gerardo, Filippi, Matteo, Spinelli, Alessandro S., Monzio Compagnoni, Christian

“…In this article, we show that, by exploiting the program and erase conditions identified in Part I of this article, operating a mainstream NOR Flash memory…”
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Experimental and Modeling Investigation of the Temperature Activation of TDDB in Galvanic Isolators Based on Polymeric Dielectrics by Mazzola, Jurij L., Greatti, Matteo, Monzio Compagnoni, Christian, Spinelli, Alessandro S., Paci, Dario, Speroni, Fabrizio, Marano, Vincenzo, Lauria, Michele, Malavena, Gerardo

“…We report experimental evidence revealing a nonmonotonic temperature dependence of time-dependent dielectric breakdown (TDDB) in galvanic isolators based on…”
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Variability Effects in Nanowire and Macaroni MOSFETs--Part II: Random Telegraph Noise by Spinelli, Alessandro S., Compagnoni, Christian Monzio, Lacaita, Andrea L.

“…In this article and in its Part I, we investigate variability effects on the threshold voltage of nanowire (NW) and Macaroni devices, focusing on random dopant…”
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Impact of Cycling on Random Telegraph Noise in 3-D NAND Flash Arrays by Nicosia, Gianluca, Goda, Akira, Spinelli, Alessandro S., Monzio Compagnoni, Christian

“…This letter investigates the cycling dependence of random telegraph noise (RTN) in 3-D NAND Flash arrays. Experimental results reveal that cycling has a very…”
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Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays-Part II: Random Telegraph Noise by Nicosia, Gianluca, Mannara, Aurelio, Resnati, Davide, Paolucci, Giovanni M., Tessariol, Paolo, Spinelli, Alessandro S., Lacaita, Andrea L., Goda, Akira, Monzio Compagnoni, Christian

“…This paper investigates the temperature dependence of random telegraph noise (RTN) in 3-D NAND Flash technologies. Experimental results on memory arrays reveal…”
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Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions by Franchini, Giulio, Spinelli, Alessandro S., Nicosia, Gianluca, Fumagalli, Ivan, Asa, Marco, Groppi, Chiara, Rinaldi, Christian, Lacaita, Andrea L., Bertacco, Riccardo, Compagnoni, Christian Monzio

“…Although metal/ferroelectric/semiconductor tunnel junctions have been attracting widespread interest as next-generation memory devices, only limited effort has…”
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A Semi-Analytical Model for Macaroni MOSFETs With Application to Vertical Flash Memories by Paolucci, Giovanni M., Spinelli, Alessandro S., Compagnoni, Christian Monzio, Tessariol, Paolo

“…We present a semianalytical model for the electrostatics and the current-voltage characteristics of Macaroni MOSFETs based on the exact solution of the Poisson…”
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Comprehensive Analysis of Random Telegraph Noise Instability and Its Scaling in Deca-Nanometer Flash Memories by Ghetti, A., Compagnoni, C.M., Spinelli, A.S., Visconti, A.

“…This paper presents a comprehensive investigation of random telegraph noise (RTN) in deca-nanometer Flash memories, considering both the nor and the nand…”
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Cycling-Induced Charge Trapping/Detrapping in Flash Memories-Part II: Modeling by Resnati, Davide, Nicosia, Gianluca, Paolucci, Giovanni M., Visconti, Angelo, Monzio Compagnoni, Christian

“…Starting from all the experimental evidence we presented in Part I of this work (Resnati et al., 2016), in this paper, we propose a new microscopic picture for…”
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Special Issue on Reliability by Mahapatra, Souvik, Chen, Kevin J., Kaczer, Ben, Pancheri, Lucio, Rosenbaum, Elyse, Mouli, Chandra, Wong, Hei, Kerber, Andreas, Monzio Compagnoni, Christian, Koval, Randy, Meneghesso, Gaudenzio, Sheridan, David, Ramey, Stephen, Wang, Runsheng, Stathis, Jim

“…Reliability is an important consideration during semiconductor technology development, which ensures that the performances of devices, circuits, and systems…”
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Random Telegraph Noise in 3D NAND Flash Memories by Spinelli, Alessandro S., Malavena, Gerardo, Lacaita, Andrea L., Monzio Compagnoni, Christian

“…In this paper, we review the phenomenology of random telegraph noise (RTN) in 3D NAND Flash arrays. The main features of such arrays resulting from their…”
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Analysis of High-Temperature Data Retention in 3D Floating-Gate nand Flash Memory Arrays by Malavena, Gerardo, Giulianini, Mattia, Chiavarone, Luca, Spinelli, Alessandro S., Monzio Compagnoni, Christian

“…In this paper, we present a detailed experimental investigation of high-temperature data retention in 3D floating-gate NAND Flash memory arrays. Data reveal…”
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Discrete-Trap Effects on 3-D NAND Variability - Part I: Threshold Voltage by Malavena, Gerardo, Amoroso, Salvatore M., Brown, Andrew R., Asenov, Plamen, Lin, Xi-Wei, Moroz, Victor, Giulianini, Mattia, Refaldi, David, Monzio Compagnoni, Christian, Spinelli, Alessandro S.

“…In this two-part article we discuss the difference between a continuous and a discrete approach to trap modeling in the simulation of 3-D NAND Flash memories…”
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Compact modeling of GIDL-assisted erase in 3-D NAND Flash strings by Malavena, Gerardo, Mannara, Aurelio, Lacaita, Andrea L., Sottocornola Spinelli, Alessandro, Monzio Compagnoni, Christian

“…This paper presents a physics-based compact model able to describe the time dynamics of the erase operation in three-dimensional NAND Flash strings exploiting…”
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