Search Results - "Colonna, J. P."
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Impact of the national prevention policy and scrum law changes on the incidence of rugby-related catastrophic cervical spine injuries in French Rugby Union
Published in British journal of sports medicine (01-05-2018)“…Catastrophic cervical spine injuries are rare in rugby union but require close monitoring. The aim of this study was to analyse the incidence of severe…”
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Ultra-high four wave mixing efficiency in slot waveguides with silicon nanocrystals
Published in Applied physics letters (07-11-2011)“…We report on wavelength conversion through four-wave-mixing in silicon slot-waveguides with embedded silicon nanocrystals. The combination of strong optical…”
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Polarization strategies to improve the emission of Si-based light sources emitting at 1.55μm
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05-06-2012)“…► We study the electroluminescence of LPCVD SiOx layers doped or not with Er ions. ► Direct current and pulsed voltage polarization have been used to compare…”
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Shaping circuit environment to face the thermal challenge Innovative technologies from low to high power electronics
Published in 2018 IEEE Symposium on VLSI Technology (01-06-2018)“…This paper describes evolutions of circuit environment to face an ever-increasing thermal challenge, from early design stage down to the final package. To…”
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Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- k Control Dielectrics
Published in IEEE transactions on electron devices (01-04-2012)“…In this paper, memory devices integrating a double layer of silicon nanocrystals (Si-ncs) as a trapping medium and a HfAlO-based control dielectrics are…”
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Evaluation of HfAlO high- k materials for control dielectric applications in non-volatile memories
Published in Microelectronic engineering (01-12-2008)“…In this paper, we evaluate the potentiality of hafnium aluminium oxide (HfAlO) high- k materials for control dielectric application in non-volatile memories…”
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Passivated TiN nanocrystals/SiN trapping layer for enhanced erasing in nonvolatile memory
Published in Applied physics letters (11-10-2010)Get full text
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Reliability of charge trapping memories with high- k control dielectrics (Invited Paper)
Published in Microelectronic engineering (01-07-2009)“…In this paper, we evaluate the potentiality of high- k materials (Al 2O 3, HfO 2 and HfAlO) for interpoly application in non-volatile memories. A study of the…”
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Thin micro-cold plate for hot-spot aware chip cooling
Published in 2016 6th Electronic System-Integration Technology Conference (ESTC) (01-09-2016)“…This work proposes a non-invasive and hot spot aware cooling approach by stacking a micro-cold plate at the backside of a chip. With trends such as 3D stacking…”
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Study of parasitic trapping in alumina used as blocking oxide for nonvolatile memories
Published in Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures (2011)“…Alumina layers deposited by Atomic Layer Deposition followed by Rapid Thermal anneal were characterized. We found that the crystallization of alumina in…”
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Thermal measurements on flip-chipped system-on-chip packages with heat spreader integration
Published in 2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) (01-03-2015)“…Amongst the cooling solutions proposed to mitigate heat hazard effects in microelectronics, heat spreaders seem to be one of the most suitable when thickness…”
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Defects-induced gap states in hydrogenated γ-alumina used as blocking layer for non-volatile memories
Published in Microelectronic engineering (01-07-2011)“…In this work we used atomistic simulation to simulate a 160-atoms supercell of γ-Al 2O 3 with various potential defects. For each defect we computed the…”
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Towards efficient and reliable 300mm 3D technology for wide I/O interconnects
Published in 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) (01-12-2012)“…This paper presents the prototype of a 3D circuit with Wide I/O interconnects in a 65nm CMOS node, assembled in a face-to-back integration and reported on a…”
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New challenges and opportunities for 3D integrations
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01-12-2015)“…From low density 3D integrations embedding Via Last Through Silicon Vias (TSV) to high densities hybrid bonding or 3D VSLI CoolCubeTM solutions, a multitude of…”
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Investigation of charge-trap memories with AlN based band engineered storage layers
Published in Solid-state electronics (01-04-2011)“…This paper presents the investigation of the electrical properties of charge-trap memories with AlN based storage layers. The memory performance and…”
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Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories
Published in Solid-state electronics (01-07-2009)Get full text
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Thermal correlation between measurements and FEM simulations in 3D ICs
Published in 2013 IEEE International 3D Systems Integration Conference (3DIC) (01-10-2013)“…This paper presents a comparison between electrical measurements, which are carried out with embedded in-situ sensors, and thermal numerical simulations. The…”
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Direct probing of trapped charge dynamics in SiN by Kelvin Force Microscopy
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01-03-2010)“…In this work, we explore the potential of Kelvin Force Microscopy (KFM) measurements to investigate the lateral charge transport in SiN layers with two…”
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Thermal performance of CoolCube™ monolithic and TSV-based 3D integration processes
Published in 2016 IEEE International 3D Systems Integration Conference (3DIC) (01-11-2016)“…CoolCube™ is a monolithic 3D technology which has the potential to solve the interconnection density limitation of the existing TSV-based 3D integration…”
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Hot spot aware microchannel cooling add-on for microelectronic chips in mobile devices
Published in 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01-05-2017)“…This work proposes an experimental microchannel solution to cool microelectronic chips with hot spots, using a nonintrusive technique. In microelectronics,…”
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