Search Results - "Collet, J.H."
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1
Performance constraints for onchip optical interconnects
Published in IEEE journal of selected topics in quantum electronics (01-03-2003)“…This work aims at defining the marks that optoelectronic solutions will have to beat for replacing electric interconnects at chip level. We first simulate the…”
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2
Production Yield and Self-Configuration in the Future Massively Defective Nanochips
Published in 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) (01-09-2007)“…We address two problems in this work, namely, 1) the resilience challenge in the future chips made up of massively defective nanoelements and organized in…”
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Conference Proceeding -
3
Order-Disorder Oscillations in the Populations of Faulty Repulsive Agents
Published in IEEE Workshop on Distributed Intelligent Systems: Collective Intelligence and Its Applications (DIS'06) (2006)“…We study the temporal evolution of populations including thousands of mobile repulsive agents. In the first part, the agents follow the rules of a…”
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Conference Proceeding -
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Comparison of fault-tolerance techniques for massively defective fine- and coarse-grained nanochips
Published in 2009 MIXDES-16th International Conference Mixed Design of Integrated Circuits & Systems (01-06-2009)“…The fundamental question addressed in this paper is how to maintain the operation dependability of future chips built from forthcoming nano- (or subnano-)…”
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Subnanosecond density dynamics of the electrondashhole plasma in GaAs/AlAs microcavities
Published in Physica. B, Condensed matter (01-05-1996)“…We study the time-resolved reflectivity spectra of distributed Fabry-Pérot (DFP) cavities following a picosecond laser excitation. The structures, which are…”
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6
Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips
Published in 2008 14th IEEE International On-Line Testing Symposium (01-07-2008)“…The downsizing of transistor dimensions enabled in the future nanotechnologies will inevitably increase the number of faults in the complex ULSI chips. To…”
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Conference Proceeding -
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Enhanced self-configurability and yield in multicore grids
Published in 2009 15th IEEE International On-Line Testing Symposium (01-06-2009)“…As we move deeper in the nanotechnology era, computer architecture is solicited to manipulate tremendous numbers of devices per chip with high defect…”
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Conference Proceeding -
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Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips
Published in 13th IEEE International On-Line Testing Symposium (IOLTS 2007) (01-07-2007)“…We describe a self-configuration methodology to tolerate defective nodes in chips organized in massively replicative architectures as those shown below in…”
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Contribution of communications to dependability in massively-defective general-purpose nanoarchitectures
Published in 12th IEEE International On-Line Testing Symposium (IOLTS'06) (2006)“…Many previous studies have analyzed the issues of dependability in the physical layers of future nanoarchitectures. Here we consider the upper layers and…”
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10
Dynamical screening in the cooling theory of high-density electron-hole plasmas
Published in Physical review. B, Condensed matter (15-04-1989)Get full text
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11
Subpicosecond response of GaAs Fabry-Perot microcavities
Published in Proceedings of Semiconducting and Semi-Insulating Materials Conference (1996)“…The temporal and spectral response of bulk GaAs Fabry-Perot microcavities have been investigated in the subpicosecond regime at room temperature. Time resolved…”
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12
Photodiffraction in InGaAs/InGaAsP multiple quantum wells enclosed in a microcavity
Published in Superlattices and microstructures (01-01-1997)“…We report new results on the diffraction properties of photoinduced gratings in InGaAs/InGaAsP MQW structures. The original feature of this device is that the…”
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