Search Results - "Collet, J.H."

  • Showing 1 - 12 results of 12
Refine Results
  1. 1

    Performance constraints for onchip optical interconnects by Collet, J.H., Caignet, F., Sellaye, F., Litaize, D.

    “…This work aims at defining the marks that optoelectronic solutions will have to beat for replacing electric interconnects at chip level. We first simulate the…”
    Get full text
    Journal Article
  2. 2

    Production Yield and Self-Configuration in the Future Massively Defective Nanochips by Zajac, P., Collet, J.H.

    “…We address two problems in this work, namely, 1) the resilience challenge in the future chips made up of massively defective nanoelements and organized in…”
    Get full text
    Conference Proceeding
  3. 3

    Order-Disorder Oscillations in the Populations of Faulty Repulsive Agents by Collet, J.H.

    “…We study the temporal evolution of populations including thousands of mobile repulsive agents. In the first part, the agents follow the rules of a…”
    Get full text
    Conference Proceeding
  4. 4

    Comparison of fault-tolerance techniques for massively defective fine- and coarse-grained nanochips by Collet, J.H., Psarakis, M., Zajac, P., Gizopoulos, D., Napieralski, A.

    “…The fundamental question addressed in this paper is how to maintain the operation dependability of future chips built from forthcoming nano- (or subnano-)…”
    Get full text
    Conference Proceeding
  5. 5

    Subnanosecond density dynamics of the electrondashhole plasma in GaAs/AlAs microcavities by Iehl, J.L., Grac, R., Collet, J.H., Pugnet, M., Buhleier, R., Bardinal, V., Fontaine, C., Legros, R.

    Published in Physica. B, Condensed matter (01-05-1996)
    “…We study the time-resolved reflectivity spectra of distributed Fabry-Pérot (DFP) cavities following a picosecond laser excitation. The structures, which are…”
    Get full text
    Journal Article
  6. 6

    Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips by Zajac, P., Collet, J.H., Napieralski, A.

    “…The downsizing of transistor dimensions enabled in the future nanotechnologies will inevitably increase the number of faults in the complex ULSI chips. To…”
    Get full text
    Conference Proceeding
  7. 7

    Enhanced self-configurability and yield in multicore grids by Kolonis, E., Nicolaidis, M., Gizopoulos, D., Psarakis, M., Collet, J.H., Zajac, P.

    “…As we move deeper in the nanotechnology era, computer architecture is solicited to manipulate tremendous numbers of devices per chip with high defect…”
    Get full text
    Conference Proceeding
  8. 8

    Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips by Collet, J.H., Zajac, P.

    “…We describe a self-configuration methodology to tolerate defective nodes in chips organized in massively replicative architectures as those shown below in…”
    Get full text
    Conference Proceeding
  9. 9

    Contribution of communications to dependability in massively-defective general-purpose nanoarchitectures by Collet, J.H., Zajac, P., Crouzet, Y., Napieralski, A.

    “…Many previous studies have analyzed the issues of dependability in the physical layers of future nanoarchitectures. Here we consider the upper layers and…”
    Get full text
    Conference Proceeding
  10. 10
  11. 11

    Subpicosecond response of GaAs Fabry-Perot microcavities by Buhleier, R., Iehl, J.L., Collet, J.H., Bardinal, V., Fontaine, C., Legros, R.

    “…The temporal and spectral response of bulk GaAs Fabry-Perot microcavities have been investigated in the subpicosecond regime at room temperature. Time resolved…”
    Get full text
    Conference Proceeding
  12. 12

    Photodiffraction in InGaAs/InGaAsP multiple quantum wells enclosed in a microcavity by Grac, R., Pugnet, M., Collet, J.H., Lambert, B., De Matos, C., L'Haridon, H., Le Corre, A., White, J.O.

    Published in Superlattices and microstructures (01-01-1997)
    “…We report new results on the diffraction properties of photoinduced gratings in InGaAs/InGaAsP MQW structures. The original feature of this device is that the…”
    Get full text
    Journal Article