Search Results - "Cole, Patrick L."

Implications of the Logical Decode on the Radiation Response of a Multi-Level Cell NAND Flash Memory by Ingalls, J. David, Gadlage, Matthew J., Duncan, Adam R., Kay, Matthew J., Cole, Patrick L., Hunt, Ken K.

“…The radiation response of a multi-level cell (MLC) NAND flash is used to determine the organization of logical states as they correspond to floating gate…”
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Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests by Olson, Brian D., Ingalls, J. David, Rice, Casey H., Hedge, Casey C., Cole, Patrick L., Duncan, Adam R., Armstrong, Sarah E.

“…Commercial gallium nitride high-electron mobility transistors are tested at Texas A&M University cyclotron. Degradation of gate and drain currents is…”
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Heavy Ion Testing of Commercial GaN Transistors in the Radio Frequency Spectrum by Armstrong, Sarah E., Bole, Ken, Bradley, Holly, Johnson, Ethan, Staggs, James, Shedd, Walter, Cole, Patrick L., Rice, Casey H., Ingalls, J. David, Hedge, Casey C., Duncan, Adam R., Olson, Brian D.

“…Commercial gallium nitride (GaN) high-electron mobility transistors (HEMTs) are tested in the radio frequency (RF) spectrum at heavy ion facilities to explore…”
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Total dose response of transconductance in MOSFETs at low temperature by Pease, R.L., Clark, S.D., Cole, P.L., Krieg, J.F., Pickel, J.C.

“…n and p channel MOSFETs from four bulk CMOS technologies and two CMOS/SIMOX technologies were characterized for total dose response up to 1 Mrad(SiO/sub 2/) at…”
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