Search Results - "Coccoli, Alberto" :: Katalog Arama

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In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk by Brozek, Tomasz, Piadena, Alberto, Weiland, Larg, Quarantelli, Michele, Coccoli, Alberto, Saxena, Sharad, Hess, Christopher, Strojwas, Andrzej

Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01-03-2023)
“…We have developed a new reliability monitoring suite, within a proprietary IP block that we call a CV® Core, with aging sensors embedded in the product layout…”

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EMI Susceptibility of a Digitally Based Analog Amplifier in a 180-nm CMOS Process by Coccoli, Alberto, Richelli, Anna, Redoute, Jean-Michel

Published in IEEE transactions on electromagnetic compatibility (01-08-2016)
“…This paper investigates and reports the susceptibility to electromagnetic interference (EMI) of a digitally based analog amplifier. The amplifier has been…”

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