Search Results - "Cirit, A"
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1
Isolated interrupted aortic arch in adulthood: A case report
Published in Herz (01-05-2015)Get full text
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Prevalence of hepatitis C virus antibodies and cryoglobulinemia in patients with leukocytoclastic vasculitis
Published in Dermatology (Basel) (1999)“…Several dermatologic manifestations of hepatitis C virus (HCV) infection have been described. The association of HCV infection, essential mixed…”
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Journal Article -
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The Meyer model revisited: why is charge not conserved? (MOS transistor)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01-10-1989)“…A new approach to computer simulation of capacitance effects in MOS transistors is presented. It is shown that charge nonconservation is the result of faulty…”
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Journal Article -
4
Transistor sizing in CMOS circuits
Published in 24th ACM/IEEE Design Automation Conference (01-10-1987)“…The problem of optimally sizing transistors in a VLSI CMOS circuit is considered. Models and algorithms for performing optimization on a single path using…”
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Conference Proceeding
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5
Hydrodynamic model of the proton-nucleus collision
Published in Physical review. D, Particles and fields (01-04-1980)Get full text
Journal Article -
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Fragment spectra in high energy proton-nucleus collisions
Published in Physical review. C, Nuclear physics (01-06-1981)Get full text
Journal Article -
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The Meyer model revisited: why is charge not conserved? MOStransistor
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01-10-1989)“…A new approach to computer simulation of capacitance effects in MOS transistors is presented. It is shown that charge nonconservation is the result of faulty…”
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Journal Article -
8
Characterizing a VLSI standard cell library
Published in Proceedings of the IEEE 1991 Custom Integrated Circuits Conference (1991)“…The author describes a set of procedures for maintaining and characterizing an ASIC (application-specific integrated circuit) standard cell library. A modular…”
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Conference Proceeding -
9
Hot carrier effects on CMOS circuit performance
Published in 1989 Proceedings of the IEEE Custom Integrated Circuits Conference (1989)“…A description is given of a hot-electron-effect analyzer incorporated into a critical path analysis tool, Ltime, for CMOS circuits. Using some empirical…”
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Conference Proceeding -
10
Switch level random pattern testability analysis
Published in Proceedings of the 25th ACM/IEEE Design Automation Conference (01-06-1988)“…We present a new statistical, probabilistic algorithm for calculating controllability and observability for signal nets assuming the circuit can be described…”
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Conference Proceeding -
11
Switch level random pattern testability analysis
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 25th ACM/IEEE conference on Design automation; 12-15 June 1988 (01-06-1988)“…We present a new statistical, probabilistic algorithm for calculating controllability and observability for signal nets assuming the circuit can be described…”
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Conference Proceeding