Search Results - "Chukhovskii, F. N"

Correcting the Characteristics of Silicon Photodiodes by Ion Implantation by Asadchikov, V. E., Dyachkova, I. G., Zolotov, D. A., Chukhovskii, F. N., Nikitina, E. V.

“…The measured electrical parameters of silicon pin photodiodes subjected to the implantation of defect-forming ions and subsequent heat treatment are analyzed,…”
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On Change in the Silicon Crystal Structure Implanted with Hydrogen Ions during Annealing Based on Three-Crystal X-Ray Diffractometry Data by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Chukhovskii, F. N., Sorokin, L. M.

“…In this paper, we present the results of a three-crystal X-ray diffractometry (XRD) study of the state of a disturbed layer formed in silicon crystals by…”
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X-Ray Diagnostics of Microstructure Defects of Silicon Crystals Irradiated by Hydrogen Ions by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Krivonosov, Yu. S., Chukhovskii, F. N.

“…Features of formation and transformation of radiation defects in near-surface layers of silicon plates that are implanted with hydrogen ions are studied. Using…”
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On the optical theorem applicability using a self-consistent wave approximation model for the grazing-incidence small-angle X-ray scattering from rough surfaces by Chukhovskii, F. N.

“…Based on a self‐consistent wave approximation (SCWA) for describing the grazing‐incidence small‐angle X‐ray scattering (GISAXS) from a random rough surface,…”
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Novel theoretical approach to the GISAXS issue: the Green function formalism using the q-Eigenwaves propagating through a twofold rough-surfaced medium by Chukhovskii, F. N., Roshchin, B. S.

“…To describe the 1D and 2D patterns of the grazing-incidence small-angle X-ray scattering (GISAXS) from a rough fractal surface, the novel integral equations…”
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X-Ray Diffraction Tomography Recovery of the 3D Displacement-Field Function of the Coulomb-Type Point Defect in a Crystal by Chukhovskii, F. N., Konarev, P. V., Volkov, V. V.

“…A successive approach to the solution of the inverse problem of the X-ray diffraction tomography (XRDT) is proposed. It is based on the semi-kinematical…”
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Computer Diffraction Tomography: A Comparative Analysis of the Use of Guided and Wavelet Filters for Image Processing by Bondarenko, V. I., Rekhviashvili, S. S., Chukhovskii, F. N.

“…Digital processing of 2D X-ray projection images of a Coulomb-type point defect in a Si(111) crystal detected against the statistical Gaussian noise background…”
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Towards the Theory of X-ray Diffraction Tomography of Crystals with Nanosized Defects by Grigorev, V. A., Konarev, P. V., Chukhovskii, F. N., Volkov, V. V.

“…X-ray diffraction tomography is an innovative method that is widely used to obtain 2D-phase-contrast diffraction images and the subsequent 3D-reconstruction of…”
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To the Solution of the Inverse Problem of X-Ray Topo-Tomography. Computer Algorithms and 3D Reconstruction on the Example of a Crystal with a Point Defect of Coulomb Type by Konarev, P. V., Chukhovskii, F. N., Volkov, V. V.

“…A successive approach to the solution of the inverse problem of diffraction X-ray topo-tomography is proposed. It is based on the semikinematic solution to the…”
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X-ray specular scattering from statistically rough surfaces: a novel theoretical approach based on the Green function formalism by Chukhovskii, F. N., Polyakov, A. M.

“…The Green function formalism is applied to the problem of grazing‐incidence small‐angle X‐ray scattering from statistically rough surfaces. Kirchhoff's…”
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Grazing‐incidence small‐angle X‐ray scattering in a twofold rough‐interface medium: a new theoretical approach using the q‐eigenwave formalism by Chukhovskii, F. N., Roshchin, B. S.

“…Based on the rigorous Green function formalism to describe the grazing‐incidence small‐angle X‐ray scattering (GISAXS) problem, a system of two linked integral…”
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Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy by Asadchikov, V. E., D’yachkova, I. G., Zolotov, D. A., Chukhovskii, F. N., Sorokin, L. M.

“…The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New…”
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Double-Crystal Rocking Curve Simulation Using 2D Spectral Angular Diagrams of X-Ray Radiation by Atknin, I. I., Marchenkov, N. V., Chukhovskii, F. N., Blagov, A. E., Kovalchuk, M. V.

“…A new approach to numerical simulation of double-crystal rocking curves is proposed. This approach is based on the use of experimental spectral angular…”
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The possibility of identifying the spatial location of single dislocations by topo-tomography on laboratory setups by Zolotov, D. A., Buzmakov, A. V., Elfimov, D. A., Asadchikov, V. E., Chukhovskii, F. N.

“…The spatial arrangement of single linear defects in a Si single crystal (input surface {111}) has been investigated by X-ray topo-tomography using laboratory…”
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Dynamic Newton-gradient-direction-type algorithm for multilayer structure determination using grazing X-ray specular scattering: numerical simulation and analysis by Chukhovskii, F. N.

“…A new dynamic iterative algorithm code for retrieving macroscopic multilayer structure parameters (the layer thickness and complex refraction index for each…”
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Study of Properties of Materials by Absorption and Diffraction X-Ray Microtomography by Asadchikov, V. E., Buzmakov, A. V., Dyachkova, I. G., Zolotov, D. A., Krivonosov, Yu. S., Rusakov, A. A., Chukhovskii, F. N.

“…Single crystals of silicon and gallstones are studied on a laboratory X-ray microtomograph with a spatial resolution of 10 μm. The tomographic experiment…”
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Lateral Inhomogeneities of Sapphire Plates Determined with the Aid of X-Ray and Probe Methods by Asadchikov, V. E., Blagov, A. E., Butashin, A. V., Volkov, Yu. O., Deryabin, A. N., Kanevskii, V. M., Muslimov, A. E., Protsenko, A. I., Roshchin, B. S., Targonskii, A. V., Chukhovskii, F. N.

“…X-ray diffractometry, X-ray profilometry, atomic-force microscopy, and sclerometer tests are employed in the study of R -cut plates of sapphire single crystals…”
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X-ray fluorescence holography: a novel treatment for crystal structure determination by Chukhovskii, F. N., Poliakov, A. M.

“…It is shown that it is possible to use a linear regression algorithm direct method to solve crystal structures from X‐ray fluorescence holography (XFH) data…”
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Ab initio crystal structure determination using X-ray fluorescence holography for different noise levels: numerical simulation and analysis by Chukhovskii, F. N., Poliakov, A. M.

“…X‐ray fluorescence holography (XFH) two‐dimensional angular scans with the fluorescing Cu atom of a Cu3Au single crystal for different noise levels have been…”
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Electron charge density imaging with X-ray holography by Chukhovskii, F.N., Novikov, D.V., Hiort, T., Materlik, G.

“…A theory of atom resolving X-ray fluorescence holography is presented. It uses the single-scattering approach to derive from Maxwell's equations a solution for…”
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