Search Results - "Choi, Jung Hae"
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Reversible transition between the polar and antipolar phases and its implications for wake-up and fatigue in HfO2-based ferroelectric thin film
Published in Nature communications (03-02-2022)“…Atomic-resolution Cs-corrected scanning transmission electron microscopy revealed local shifting of two oxygen positions (O I and O II ) within the unit cells…”
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2
Atomic Layer Deposition of Sb2Te3/GeTe Superlattice Film and Its Melt‐Quenching‐Free Phase‐Transition Mechanism for Phase‐Change Memory
Published in Advanced materials (Weinheim) (15-12-2022)“…Atomic layer deposition (ALD) of Sb2Te3/GeTe superlattice (SL) film on planar and vertical sidewall areas containing TiN metal and SiO2 insulator is…”
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3
Ferroelectric switching in bilayer 3R MoS2 via interlayer shear mode driven by nonlinear phononics
Published in Scientific reports (17-10-2019)“…We theoretically investigate the mechanism of ferroelectric switching via interlayer shear in 3R MoS 2 using first principles and lattice dynamics…”
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4
AMMCR: Ab initio model for mobility and conductivity calculation by using Rode Algorithm
Published in Computer physics communications (01-02-2021)“…We present a module to calculate the mobility and conductivity of semiconducting materials using Rode’s algorithm. This module uses a variety of electronic…”
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5
Equilibrium crystal shape of GaAs and InAs considering surface vibration and new (111)B reconstruction: ab-initio thermodynamics
Published in Scientific reports (04-02-2019)“…This work reports on the theoretical equilibrium crystal shapes of GaAs and InAs as a function of temperature and pressure, taking into account the…”
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6
Role of the Short‐Range Order in Amorphous Oxide on MoS2/a‐SiO2 and MoS2/a‐HfO2 Interfaces
Published in physica status solidi (b) (01-08-2019)“…The interface structures between MoS2 and amorphous oxides of SiO2 and HfO2 (MoS2/a‐SiO2 and MoS2/a‐HfO2) are investigated through ab‐initio molecular dynamics…”
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Comparison of interfaces, band alignments, and tunneling currents between crystalline and amorphous silica in Si/SiO2/Si structures
Published in Materials research express (01-04-2022)“…Recently, to improve the performance of an integrated metal-oxide-semiconductor (MOS) device, an attempt has been made in the industry to replace the amorphous…”
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8
Free-electron creation at the 60° twin boundary in Bi2Te3
Published in Nature communications (16-08-2016)“…Interfaces, such as grain boundaries in a solid material, are excellent regions to explore novel properties that emerge as the result of local…”
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9
Surface reconstruction of InAs (001) depending on the pressure and temperature examined by density functional thermodynamics
Published in Scientific reports (06-09-2017)“…A detailed understanding of the atomic configuration of the compound semiconductor surface, especially after reconstruction, is very important for the device…”
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10
Surface morphology evolution and underlying defects in homoepitaxial growth of GaAs (110)
Published in Journal of alloys and compounds (05-09-2021)“…The evolution of the surface morphology and underlying pyramidal defects in homoepitaxial GaAs (110) layers was investigated with respect to the layer…”
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11
Reduction of the Hysteresis Voltage in Atomic‐Layer‐Deposited p‐Type SnO Thin‐Film Transistors by Adopting an Al2O3 Interfacial Layer
Published in Advanced electronic materials (01-07-2019)“…The origin of hysteresis in the drain–source current (IDS)–gate‐source voltage (VGS) characteristics of atomic‐layer‐deposited (ALD) p‐type SnO thin‐film…”
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12
Atomic and electronic structures of a-ZnSnO3/a-SiO2 interface by ab initio molecular dynamics simulations
Published in physica status solidi (b) (01-09-2016)“…The interface between amorphous ZnSnO3 and amorphous SiO2 was investigated by ab initio molecular dynamic simulations. The radial distribution function at the…”
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13
Ordered Electronic Reconstruction of the (112¯0$11\bar{2}0$) ZnO Single Crystal
Published in Advanced electronic materials (01-07-2023)“…Three‐dimensional (3D) charge‐written periodic peak and valley nanoarray surfaces are fabricated on a (112¯0$11\bar{2}0$) ZnO single crystal grown via chemical…”
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14
The Contrasting Impacts of the Al2O3 and Y2O3 Insertion Layers on the Crystallization of ZrO2 Films for Dynamic Random Access Memory Capacitors
Published in Advanced electronic materials (01-07-2022)“…This study examines the influences of the Al2O3 and Y2O3 insertion layers (ILs) on the structural and electrical features of ZrO2 thin films for their…”
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15
A First-Principles Study on the Oxygen Adsorption and Interface Characteristics with a-GeO2 of Ge[001] Nanowire
Published in Journal of the Korean Physical Society (01-08-2019)“…Astract First-principles calculations were performed to study the atomic and the electronic structures of the oxygen adsorption on the sidewalls of Ge[001]…”
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16
Scalable excitatory synaptic circuit design using floating gate based leaky integrators
Published in Scientific reports (14-12-2017)“…We propose a scalable synaptic circuit realizing spike timing dependent plasticity (STDP)—compatible with randomly spiking neurons. The feasible working of the…”
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17
Structure and mechanical properties of Ag-incorporated DLC films prepared by a hybrid ion beam deposition system
Published in Thin solid films (03-12-2007)“…Ag-incorporated diamond-like carbon films were prepared on Si(100) wafers using a hybrid deposition system composed of an end-Hall-type hydrocarbon ion gun and…”
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Journal Article Conference Proceeding -
18
A novel class of oxynitrides stabilized by nitrogen dimer formation
Published in Scientific reports (27-09-2018)“…Despite the wide applicability of oxynitrides from photocatalysis to refractory coatings, our understanding of the materials has been limited in terms of their…”
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19
Resistance switching behavior of atomic layer deposited SrTiO3 film through possible formation of Sr2Ti6O13 or Sr1Ti11O20 phases
Published in Scientific reports (02-02-2016)“…Identification of microstructural evolution of nanoscale conducting phase, such as conducting filament (CF), in many resistance switching (RS) devices is a…”
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20
Performance Variation According to Device Structure and the Source/Drain Metal Electrode of a-IGZO TFTs
Published in IEEE transactions on electron devices (01-12-2012)“…The transmission-line method (TLM) was adopted to clarify the causes of device performance variation according to the source/drain metal electrode and device…”
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