Search Results - "Chmara, Frank"
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Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis
Published in Journal of vacuum science & technology. A, Vacuum, surfaces, and films (01-03-2001)“…A cesium sputter ion source has been used to generate novel cluster and monoatomic primary ion beams for secondary ion mass spectrometry (SIMS). The source…”
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Journal Article -
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Development of a triplasmatron ion source for the generation of SF5+ and F− primary ion beams on an ion microscope secondary ion mass spectrometry instrument
Published in Journal of vacuum science & technology. A, Vacuum, surfaces, and films (01-05-1999)“…A hot filament duoplasmatron ion source operating with argon has been modified by the addition of an enclosed expansion cup mounted to the extraction side of…”
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Journal Article -
3
Recent Advances and Developments in Electrostatic Accelerators
Published in IEEE transactions on nuclear science (01-01-1971)“…Negative heavy ions (O-, Cu-, AlO-, Au-) were injected into and accelerated through a one megavolt tandem accelerator. Transmission of the charge states was…”
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Journal Article -
4
Development of a triplasmatron ion source for the generation of SF 5 + and F − primary ion beams on an ion microscope secondary ion mass spectrometry instrument
Published in Journal of vacuum science & technology. A, Vacuum, surfaces, and films (01-05-1999)“…A hot filament duoplasmatron ion source operating with argon has been modified by the addition of an enclosed expansion cup mounted to the extraction side of…”
Get full text
Journal Article