Search Results - "Chkhalo, Nikolai"
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Periodic Multilayer for X-ray Spectroscopy in the Li K Range
Published in Applied sciences (01-07-2021)“…X-ray spectroscopy of lithium is very difficult, even impossible, with wavelength dispersive spectrometers commonly deployed on scanning electron microscopes…”
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Influence of silicon interlayers on the structural and reflective X‐ray characteristics of Ni/Ti multilayer mirrors
Published in Journal of applied crystallography (01-10-2024)“…The influence of Si interlayers on the microstructure of the films and boundaries and on the reflective characteristics of Ti/Ni multilayer mirrors has been…”
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Journal Article