Search Results - "Chistyakov, M. G."

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    Study of the Sensitive Region of a MOS Transistor to the Effects of Secondary Particles Arising from Ionizing Radiation by Glushko, A. A., Morozov, S. A., Chistyakov, M. G.

    Published in Russian microelectronics (01-08-2023)
    “…It was shown in [1, 2] that the dependence of the fault tolerance of a static RAM cell on the energy of secondary particles resulting from the action of a…”
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    Journal Article
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