Search Results - "Chistyakov, M. G."
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Study of the Sensitive Region of a MOS Transistor to the Effects of Secondary Particles Arising from Ionizing Radiation
Published in Russian microelectronics (01-08-2023)“…It was shown in [1, 2] that the dependence of the fault tolerance of a static RAM cell on the energy of secondary particles resulting from the action of a…”
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Scheie's syndrome
Published in Voprosy okhrany materinstva i detstva (01-10-1973)Get more information
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