Search Results - "Chimenton, A."

Modeling of SET seasoning effects in Phase Change Memory arrays by Zambelli, C., Chimenton, A., Olivo, P.

“…The experimental analysis of the electrical behavior of Phase Change Memory arrays evidenced a seasoning effect both on SET and RESET state. The previous…”
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Empirical investigation of SET seasoning effects in Phase Change Memory arrays by Zambelli, C., Chimenton, A., Olivo, P.

“…► We present the SET seasoning phenomenon in Phase Change Memory (PCM) arrays. ► We characterized the SET seasoning in relation to the erasing scheme exploited…”
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Fast Identification of Critical Electrical Disturbs in Nonvolatile Memories by Chimenton, A., Olivo, P.

“…We propose a new methodology for a fast top-down identification of disturbs in large arrays of nonvolatile memories. The new strategy aims at providing the set…”
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Data retention after heavy ion exposure of floating gate memories: analysis and simulation by Larcher, L., Cellere, G., Paccagnella, A., Chimenton, A., Candelori, A., Modelli, A.

“…Floating gate (FG) memories are the most important of current nonvolatile memory technologies. We are investigating the long-term retention issues in advanced…”
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Anomalous charge loss from floating-gate memory cells due to heavy ions irradiation by Cellere, G., Paccagnella, A., Larcher, L., Chimenton, A., Wyss, J., Candelori, A., Modelli, A.

“…We are presenting new data on the charge loss in large floating gate (FG) memory arrays subjected to heavy ion irradiation. Existing models for charge loss…”
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Impact of Pulsed Operation on Performance and Reliability of Flash Memories by Chimenton, A., Irrera, F., Olivo, P.

“…We tested the impact of pulsed operation (PO) on standard NOR flash memory arrays. PO is a new writing scheme featuring a sequence of ultrashort high-voltage…”
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Overerase phenomena: an insight into flash memory reliability by Chimenton, A., Pellati, P., Olivo, P.

“…The most important reliability issues related to the erasing operation in flash memories are, still today, caused by single bit failures. In particular, the…”
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Radiation effects on floating-gate memory cells by Cellere, G., Pellati, P., Chimenton, A., Wyss, J., Modelli, A., Larcher, L., Paccagnella, A.

“…We have addressed the problem of threshold voltage (V/sub TH/) variation in flash memory cells after heavy-ion irradiation by using specially designed array…”
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Impact of high tunneling electric fields on erasing instabilities in NOR flash memories by Chimenton, A., Olivo, P.

“…Experimental data and analysis show that overerase effects in NOR Flash memories increase with the electric field used during erasing. We found that the…”
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Constant charge erasing scheme for flash memories by Chimenton, A., Pellati, P., Olivo, P.

“…This paper presents a new erasing scheme for flash memories based on a sequence of bulk to gate-box pulses with increasing voltage amplitude. It is…”
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Improving performance and reliability of NOR-Flash arrays by using pulsed operation by Chimenton, A., Irrera, F., Olivo, P.

“…Pulsed Operation (PO) is a new writing methodology based on a sequence of high voltage ultra-short pulses allowing of improving both performance and…”
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Reliability of flash memory erasing operation under high tunneling electric fields by Chimenton, A., Olivo, P.

“…Experimental results show that the use of high electric fields during erasing of flash memories leads to a degradation of the reliability due to the increase…”
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Analysis of erratic bits in flash memories by Chimenton, A., Pellati, P., Olivo, P.

“…This work presents experimental results concerning erratic behavior in flash memories obtained by tracking the threshold voltage dynamics during any single…”
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A Statistical Model of Erratic Behaviors in Flash Memory Arrays by Chimenton, A., Zambelli, C., Olivo, P.

“…We present a statistical model of erratic behaviors in Flash memory arrays based on a Markov chain model. The model parameters are experimentally evaluated…”
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Empirical investigation of SET seasoning effects in Phase Change Memory arrays: Special Issue Devoted to the 2nd International Memory Workshop (IMW 2010) by ZAMBELLI, C, CHIMENTON, A, OLIVO, P

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Statistical Modeling of Secondary Path During Erase Operation in Phase Change Memories by Zambelli, C., Chimenton, A., Olivo, P.

“…In this paper, we analyze the read current shifts that have been observed after the erase operations in phase change memory arrays. Experimental data analyses…”
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Set of Electrical Characteristic Parameters Suitable for Reliability Analysis of Multimegabit Phase Change Memory Arrays by Chimenton, A., Zambelli, C., Olivo, P., Pirovano, A.

“…In this paper we define a set of few electrical parameters aimed at giving a complete picture of the phase change memory array behavior during writing/reading…”
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A New Analytical Model of the Erasing Operation in Phase-Change Memories by Chimenton, A., Zambelli, C., Olivo, P.

“…In this letter, we present a new analytical model of the erasing operation in phase-change memories (PCMs). The model successfully describes the dynamics of…”
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Erratic erase in flash memories. I. Basic experimental and statistical characterization by Chimenton, A., Olivo, P.

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Call for papers: ICEAA - IEEE APWC by Chimenton, A., Olivo, P.

“…For pt.I see ibid., vol.50, pp.1009-14 (2003). This paper presents experimental results about the erratic erase phenomena occurring in Flash Memories with the…”
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