Method of Simulated Annealing in the Problems of Diagnostics of Linear Radio Electronic Circuits Using the Lie Hypothesis

In recent years, the problem of diagnosing defects in radio-electronic circuits has become highly relevant. Developing a method capable of diagnosing a faulty component and determining its parameter value in radio-electronic circuits, especially when there are a large number of components in the cir...

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Bibliographic Details
Published in:	2024 International Seminar on Electron Devices Design and Production (SED) pp. 1 - 4
Main Authors:	Hai, Nguyen Duc, Uvaysov, Saygid U., Chernoverskaya, Victoria V., Hai, Vo The, Hanh, Pham Xuan
Format:	Conference Proceeding
Language:	English
Published:	IEEE 02-10-2024
Subjects:	Annealing simulation algorithm Circuit faults defective component Electron devices Electronic circuits Fault diagnosis linear electronic circuit nominal parameter value Optimization output voltage Production Seminars Simulated annealing
Online Access:	Get full text
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Summary:	In recent years, the problem of diagnosing defects in radio-electronic circuits has become highly relevant. Developing a method capable of diagnosing a faulty component and determining its parameter value in radio-electronic circuits, especially when there are a large number of components in the circuit, is a complex task. Optimization algorithms, particularly the simulated annealing algorithm, have found wide application and are very effective for optimization tasks. The application of this algorithm to the problem of fault diagnosis in radioelectronic circuits has not been studied. In this article, we use the simulated annealing algorithm in combination with Lee's hypothesis to develop a new modification that can diagnose faulty components in radio-electronic circuits. This new modification works well, and we have proven it below.
DOI:	10.1109/SED63331.2024.10741049