Search Results - "Chen, Tom W."

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    When Molecular-Targeted Agents Meet Immunotherapy: The Opportunities for Soft Tissue Sarcoma by Wainsztein, Vanina E, Chen, Tom W

    “…Soft tissue sarcomas (STS) account for less than 1% of adult cancers with a median overall survival of 12 months in the metastatic setting. Although…”
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    Journal Article
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    Proteomic features of soft tissue tumours in adolescents and young adults by Tam, Yuen Bun, Low, Kaan, PS, Hari, Chadha, Madhumeeta, Burns, Jessica, Wilding, Christopher P., Arthur, Amani, Chen, Tom W., Thway, Khin, Sadanandam, Anguraj, Jones, Robin L., Huang, Paul H.

    Published in Communications medicine (18-05-2024)
    “…Background Adolescents and young adult (AYA) patients with soft tissue tumours including sarcomas are an underserved group with disparities in treatment…”
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    Journal Article
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    Post Silicon Power/Performance Optimization in the Presence of Process Variations Using Individual Well-Adaptive Body Biasing by Gregg, J., Chen, T.W.

    “…The economics of continued scaling of silicon process technologies beyond the 90-nm node will face significant challenges due to variability. The increasing…”
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    Journal Article
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    CMOS optoelectronic components for clock distribution by Pownall, Robert, Thangaraj, Charles, Yuan, Guangwei, Nikkel, Phil, Chen, Tom W., Lear, Kevin L.

    Published in Microelectronic engineering (01-10-2010)
    “…Optoelectronic components for clock distribution that are fully compatible with all standard CMOS processes are described. Waveguide cores are silicon nitride,…”
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    Journal Article
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    Assessing merged DRAM/Logic technology by Kim, Ytong-Bin, Chen, Tom W.

    Published in Integration (Amsterdam) (1999)
    “…This paper describes the impact of DRAM process on the logic circuit performance of Memory/Logic Merged Integrated Circuit and the alternative circuit design…”
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    Journal Article
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    Geometry Dependence of CMOS-Compatible, Polysilicon, Leaky-Mode Photodetectors by Pownall, R., Guangwei Yuan, Chen, T.W., Nikkel, P., Lear, K.L.

    Published in IEEE photonics technology letters (01-04-2007)
    “…Complementary metal-oxide-semiconductor-compatible metal-semiconductor-metal polysilicon photodiodes fabricated in a commercial 0.35-mum technology offer…”
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    Journal Article
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    Sensitivity analysis of critical parameters in board test by Tegethoff, M.M.V., Chen, T.W.

    Published in IEEE design & test of computers (01-01-1996)
    “…The authors analyze the main contributors to the quality and cost of complex boards. With manufacturing data from Hewlett-Packard boards, they use simulation…”
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    Journal Article
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    A clustered yield model for SMT boards and MCM's by Tegethoff, M.M.V., Chen, T.W.

    “…This paper describes a clustered yield model for complex surface mount technology (SMT) assemblies and multichip modules (MCM's). Based on yield modeling…”
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    Journal Article
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    A low cost individual-well adaptive body bias (IWABB) scheme for leakage power reduction and performance enhancement in the presence of intra-die variations by Chen, T.W., Gregg, J.

    “…This paper presents a new method of adapting body biasing on a chip during post-fabrication testing in order to mitigate the effects of process variations…”
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    Conference Proceeding
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    A Low Cost Individual-Well Adaptive Body Bias (IWABB) Scheme for Leakage Power Reduction and Performance Enhancement in the Presence of Intra-Die Variations by Chen, Tom W., Gregg, Justin

    “…This paper presents a new method of adapting body biasing on a chip during post-fabrication testing in order to mitigate the effects of process variations…”
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    Conference Proceeding
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    Complexity reduction for analog circuit performance models using random forests by Tsau-Shuan Wu, Alkan, C., Chen, T. W.

    “…Most existing optimization methods for analog circuits focus on the accuracy of their performance modeling techniques, which results in complicated and…”
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    Conference Proceeding
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    Improving SER Immunity of Combinational Logic Using Combinations of Spatial and Temporal Checking by Tsau-Shuan Wu, Alkan, C., Chen, T.W.

    “…Radiation-induced soft errors on large-scale integrated circuits are becoming increasingly problematic as device sizes are scaled down, operating voltages are…”
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    Conference Proceeding
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    Optimization of individual well adaptive body biasing (IWABB) using a multiple objective evolutionary algorithm by Gregg, J., Chen, T.W.

    “…Mitigating the effects process variations on power-frequency distributions can be done by using a system of locally-generated body biases. This system allows…”
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    Conference Proceeding
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    Post silicon power/performance optimization in the presence of process variations using individual well adaptive body biasing (IWABB) by Gregg, J., Chen, T.W.

    “…Continued scaling of silicon process technologies beyond the 90nm node will face problems due to within die process variations. The increasing relative…”
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    Conference Proceeding
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    Geometry Dependence of Leaky-Mode, Waveguide-Coupled, Polysilicon Photodetectors by Pownall, B., Yuan, G., Chen, T.W., Nikkel, P., Lear, K.L.

    “…Characterization of leaky-mode coupled polysilicon MSM photodetectors fabricated in 0.35 mum commercial CMOS with varying contact spacing and length reveals…”
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    Conference Proceeding