Search Results - "Chen, Kevin J."
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GaN-on-Si Power Technology: Devices and Applications
Published in IEEE transactions on electron devices (01-03-2017)“…In this paper, we present a comprehensive review and discussion of the state-of-the-art device technology and application development of GaN-on-Si power…”
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Interface Engineering of Monolayer MoS2/GaN Hybrid Heterostructure: Modified Band Alignment for Photocatalytic Water Splitting Application by Nitridation Treatment
Published in ACS applied materials & interfaces (23-05-2018)“…Interface engineering is a key strategy to deal with the two-dimensional (2D)/three-dimensional (3D) hybrid heterostructure, since the properties of this…”
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An Analytical Model for False Turn-On Evaluation of High-Voltage Enhancement-Mode GaN Transistor in Bridge-Leg Configuration
Published in IEEE transactions on power electronics (01-08-2017)“…Compared with the state-of-the-art Si-based power devices, enhancement-mode Gallium Nitride (E-mode GaN) transistors have better figures of merit and exhibit…”
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Maximizing the Performance of 650-V p-GaN Gate HEMTs: Dynamic RON Characterization and Circuit Design Considerations
Published in IEEE transactions on power electronics (01-07-2017)“…The systematic characterization of a 650-V/13-A enhancement-mode GaN power transistor with p-GaN gate is presented. Critical device parameters such as…”
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Effective Passivation of AlGaN/GaN HEMTs by ALD-Grown AlN Thin Film
Published in IEEE electron device letters (01-04-2012)“…An effective passivation technique for AlGaN/GaN high-electron-mobility transistors (HEMTs) is presented. This technique features an AlN thin film grown by…”
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Identification of Trap States in p-GaN Layer of a p-GaN/AlGaN/GaN Power HEMT Structure by Deep-Level Transient Spectroscopy
Published in IEEE electron device letters (01-05-2020)“…In this work, the deep-level transient spectroscopy (DLTS) is conducted to investigate the gate stack of the <inline-formula> <tex-math notation="LaTeX">{p}…”
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Formation and Applications in Electronic Devices of Lattice‐Aligned Gallium Oxynitride Nanolayer on Gallium Nitride
Published in Advanced materials (Weinheim) (01-03-2023)“…Gallium nitride (GaN), a promising alternative semiconductor to Si, is widely used in photoelectronic and electronic technologies. However, the vulnerability…”
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Vertical Leakage/Breakdown Mechanisms in AlGaN/GaN-on-Si Devices
Published in IEEE electron device letters (01-08-2012)“…Vertical leakage/breakdown mechanisms in AlGaN/GaN high-electron-mobility transistors grown on low-resistivity p-type (111) Si substrate are studied by…”
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GaN power IC technology on p -GaN gate HEMT platform
Published in Japanese Journal of Applied Physics (01-04-2020)“…GaN power ICs provide an elegant solution for high-frequency power switching applications. This paper will first discuss the GaN power integration platform,…”
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Kink Effect in AlGaN/GaN HEMTs Induced by Drain and Gate Pumping
Published in IEEE electron device letters (01-04-2011)“…Kink effects are studied in conventional AlGaN/GaN high-electron-mobility transistors by measuring their current-voltage characteristics with various bias…”
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Proposal of a GaN/SiC Hybrid Field-Effect Transistor for Power Switching Applications
Published in IEEE transactions on electron devices (01-06-2016)“…A GaN/SiC hybrid field-effect transistor (HyFET) is proposed as a high-voltage power device that provides a high-mobility lateral AlGaN/GaN channel to reduce…”
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Threshold Voltage Instability in Al2O3/GaN/AlGaN/GaN Metal--Insulator--Semiconductor High-Electron Mobility Transistors
Published in Jpn J Appl Phys (01-11-2011)“…The threshold voltage ($V_{\text{th}}$) instability in GaN-based metal--insulator--semiconductor high-electron mobility transistors (MIS-HEMTs) with 15-nm…”
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High Uniformity Normally-OFF GaN MIS-HEMTs Fabricated on Ultra-Thin-Barrier AlGaN/GaN Heterostructure
Published in IEEE electron device letters (01-12-2016)“…Ultra-thin-barrier (UTB) AlGaN/GaN heterostructure is utilized for fabrication of normally-OFF GaN metal- insulator-semiconductor high-electron-mobility…”
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Influence of AlN Passivation on Dynamic ON-Resistance and Electric Field Distribution in High-Voltage AlGaN/GaN-on-Si HEMTs
Published in IEEE transactions on electron devices (01-08-2014)“…We investigate in detail the influence of AlN passivation on dynamic ON-resistance (R ON ) and electric field (E-field) distribution in high-voltage AlGaN/GaN…”
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Low On-Resistance Normally-Off GaN Double-Channel Metal-Oxide-Semiconductor High-Electron-Mobility Transistor
Published in IEEE electron device letters (01-12-2015)“…A low on-resistance normally-off GaN double-channel metal-oxide-semiconductor high-electron-mobility transistor (DC-MOS-HEMT) is proposed and demonstrated in…”
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Off-State Breakdown Characterization in AlGaN/GaN HEMT Using Drain Injection Technique
Published in IEEE transactions on electron devices (01-07-2010)“…AlGaN/GaN high-electron mobility transistor's (HEMT's) off-state breakdown is investigated using drain-current injection techniques with different injection…”
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O3-sourced atomic layer deposition of high quality Al2O3 gate dielectric for normally-off GaN metal-insulator-semiconductor high-electron-mobility transistors
Published in Applied physics letters (19-01-2015)“…High quality Al2O3 film grown by atomic layer deposition (ALD), with ozone (O3) as oxygen source, is demonstrated for fabrication of normally-off AlGaN/GaN…”
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Optical pumping of deep traps in AlGaN/GaN-on-Si HEMTs using an on-chip Schottky-on-heterojunction light-emitting diode
Published in Applied physics letters (02-03-2015)“…In this work, by using an on-chip integrated Schottky-on-heterojunction light-emitting diode (SoH-LED) which is seamlessly integrated with the AlGaN/GaN high…”
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Effectiveness of controlling COVID-19 epidemic by implementing soft lockdown policy and extensive community screening in Taiwan
Published in Scientific reports (14-07-2022)“…Strict and repeated lockdowns have caused public fatigue regarding policy compliance and had a large impact on several countries’ economies. We aimed to…”
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Investigation of buffer traps in AlGaN/GaN-on-Si devices by thermally stimulated current spectroscopy and back-gating measurement
Published in Applied physics letters (06-01-2014)“…Thermally stimulated current (TSC) spectroscopy and high-voltage back-gating measurement are utilized to study GaN buffer traps specific to AlGaN/GaN lateral…”
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