Search Results - "Chegal, W"

Dielectric function of polycrystalline α -Ag2S by spectroscopic ellipsometry by Diware, M. S., Ganorkar, S. P., Kim, J., Bramhe, S. N., Cho, H. M., Cho, Y. J., Chegal, W.

“…Complex optical properties (ε=ε1+iε2) of polycrystalline bulk α-Ag2S are investigated by spectroscopic ellipsometry from 0.5 to 8.5 eV at room temperature. The…”
Get full text

Solution immersed silicon (SIS)-based biosensors: a new approach in biosensing by Diware, M S, Cho, H M, Chegal, W, Cho, Y J, Jo, J H, O, S W, Paek, S H, Yoon, Y H, Kim, D

“…A novel, solution immersed silicon (SIS)-based sensor has been developed which employs the non-reflecting condition (NRC) for a p-polarized wave. The SIS…”
Get more information

A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films by Chegal, Won, Cho, Yong Jai, Kim, Hyun Jong, Cho, Hyun Mo, Lee, Yun Woo, Kim, Soo Hyun

“…We proposed spectral imaging ellipsometry that uniquely combines one-dimensional imaging and spectroscopic ellipsometry. This type of ellipsometry enables the…”
Get full text