Search Results - "Chau, Ken"
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The temporospatial epidemiology of rheumatic heart disease in Far North Queensland, tropical Australia 1997-2017; impact of socioeconomic status on disease burden, severity and access to care
Published in PLoS neglected tropical diseases (14-01-2021)“…The incidence of rheumatic heart disease (RHD) among Indigenous Australians remains one of the highest in the world. Many studies have highlighted the…”
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The aetiology and incidence of infective endocarditis in people living with rheumatic heart disease in tropical Australia
Published in European journal of clinical microbiology & infectious diseases (01-09-2023)“…Purpose To define the incidence and microbiological aetiology of infective endocarditis (IE) in patients with rheumatic heart disease (RHD) in tropical…”
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Echocardiographic Screening Detects a Significant Burden of Rheumatic Heart Disease in Australian Torres Strait Islander Children and Missed Opportunities for its Prevention
Published in The American journal of tropical medicine and hygiene (11-01-2021)“…Rheumatic heart disease (RHD) is almost entirely preventable, but its incidence in indigenous Australians remains one of the highest in the world. A…”
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Antibiotic Prophylaxis for Melioidosis in Patients Receiving Hemodialysis in the Tropics? One Size Does Not Fit All
Published in The American journal of tropical medicine and hygiene (01-01-2018)“…Melioidosis has a high case fatality rate and is more common in patients with chronic kidney disease. Some authors recommended trimethoprim/sulfamethoxazole…”
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Machine Learning-Based Detection Method for Wafer Test Induced Defects
Published in IEEE transactions on semiconductor manufacturing (01-05-2021)“…Wafer test is carried out after integrated circuits (IC) fabrication to screen out bad dies. In addition, the results can be used to identify problems in the…”
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Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement
Published in IEEE transactions on semiconductor manufacturing (01-02-2021)“…Wafer map defect pattern recognition provides useful clues to yield learning. However, most wafer maps have no special spatial patterns and are full of noises,…”
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TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning
Published in IEEE transactions on semiconductor manufacturing (01-05-2022)“…Wafer failure pattern recognition can be used for root cause analysis, which is very important for yield learning. Recently, TestDNA was proposed to improve…”
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TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition
Published in IEEE transactions on semiconductor manufacturing (01-08-2020)“…The spatial failure patterns in wafer defect maps can be related to problems in the manufacturing and test process. Therefore, failure pattern recognition can…”
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Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization
Published in IEEE transactions on semiconductor manufacturing (01-05-2022)“…Spatial failure patterns in wafer defect maps are very useful for root cause analysis, which is essential for yield optimization in the manufacturing process…”
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Wafer Defect Pattern Classification with Explainable-Decision Tree Technique
Published in 2022 IEEE International Test Conference (ITC) (01-09-2022)“…Local defect patterns (LDP) in wafer maps are usually induced by problems in the manufacturing process. Therefore, defect pattern recognition is useful for…”
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Conference Proceeding -
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TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning
Published in 2020 IEEE International Test Conference (ITC) (01-11-2020)“…We propose a machine learning based method targeted for accurate wafer defect map classification. The proposed method is referred to as TestDNA-E, as it…”
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Conference Proceeding -
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Innovative Practice on Wafer Test Innovations
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01-04-2020)“…Wafer test integrates innovative works from upstream, automatic test equipment (ATE); middle stream, 2.3D/2.5D; and downstream, statistical analysis of…”
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Conference Proceeding -
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TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning
Published in 2019 IEEE International Test Conference (ITC) (01-11-2019)“…Wafer defect maps exhibit spatial failure pattern recognition for root cause analysis to improve defect diagnosis resolution and yield learning conventionally…”
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Conference Proceeding -
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Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01-03-2020)“…Wafer defect maps provide precious information of fabrication and test process defects, so they can be used as valuable sources to improve fabrication and test…”
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Alcohol Exposure in Breastfed Neonates Associated with Chinese Chicken Wine
Published in Indian journal of pediatrics (01-12-2016)Get full text
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5344 EPIDEMIOLOGY OF GLOMERULAR DISEASES IN THE PRE- AND POST-COVID-19 ERA IN CENTRAL QUEENSLAND, AUSTRALIA
Published in Nephrology, dialysis, transplantation (14-06-2023)Get full text
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PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques
Published in 2020 IEEE European Test Symposium (ETS) (01-05-2020)“…Wafermap defect pattern detection and diagnosis provide useful clue to yield learning. However, most wafermaps have no special spatial patterns and are full of…”
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2754 EPIDEMIOLOGY OF PAUCI-IMMUNE ANCA-ASSOCIATED GLOMERULONEPHRITIS – REPORT FROM AN AUSTRALIAN POPULATION-BASED STUDY
Published in Nephrology, dialysis, transplantation (14-06-2023)Get full text
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