Search Results - "Chau, Ken"

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    The aetiology and incidence of infective endocarditis in people living with rheumatic heart disease in tropical Australia by Basaglia, Andrew, Kang, Katherine, Wilcox, Rob, Lau, Alistair, McKenna, Kylie, Smith, Simon, Chau, Ken W. T., Hanson, Josh

    “…Purpose To define the incidence and microbiological aetiology of infective endocarditis (IE) in patients with rheumatic heart disease (RHD) in tropical…”
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    Journal Article
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    Antibiotic Prophylaxis for Melioidosis in Patients Receiving Hemodialysis in the Tropics? One Size Does Not Fit All by Chau, Ken W T, Smith, Simon, Kang, Katherine, Dheda, Shyam, Hanson, Josh

    “…Melioidosis has a high case fatality rate and is more common in patients with chronic kidney disease. Some authors recommended trimethoprim/sulfamethoxazole…”
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    Journal Article
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    Machine Learning-Based Detection Method for Wafer Test Induced Defects by Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Li, Ji-Wei, Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chun-Lung

    “…Wafer test is carried out after integrated circuits (IC) fabrication to screen out bad dies. In addition, the results can be used to identify problems in the…”
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    Journal Article
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    Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement by Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E., Liang, Hsin-Chung, Hsu, Chung-Lung

    “…Wafer map defect pattern recognition provides useful clues to yield learning. However, most wafer maps have no special spatial patterns and are full of noises,…”
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    Journal Article
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    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Cheng, Ken Chau-Cheung, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

    “…Wafer failure pattern recognition can be used for root cause analysis, which is very important for yield learning. Recently, TestDNA was proposed to improve…”
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    Journal Article
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    TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition by Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Cheng, Ken Chau-Cheung, Jiang, Xu-Hao, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun

    “…The spatial failure patterns in wafer defect maps can be related to problems in the manufacturing and test process. Therefore, failure pattern recognition can…”
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    Journal Article
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    Wafer Defect Pattern Classification with Explainable-Decision Tree Technique by Cheng, Ken Chau-Cheung, Li, Katherine Shu-Min, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Lee, Chen-Shiun, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Tsai, Nova Cheng-Yen

    “…Local defect patterns (LDP) in wafer maps are usually induced by problems in the manufacturing process. Therefore, defect pattern recognition is useful for…”
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    Conference Proceeding
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    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Chen, Leon Li-Yang, Li, Katherine Shu-Min, Cheng, Ken Chau-Cheung, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

    “…We propose a machine learning based method targeted for accurate wafer defect map classification. The proposed method is referred to as TestDNA-E, as it…”
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    Conference Proceeding
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    Innovative Practice on Wafer Test Innovations by Hu, Dyi-Chung, Hashimoto, Hirohito, Tseng, Li-Fong, Cheng, Ken Chau-Cheung, Shu-Min Li, Katherine, Wang, Sying-Jyan, Chen, Sean Y.-S., Chen, Jwu E, Liu, Clark, Huang, Andrew

    Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01-04-2020)
    “…Wafer test integrates innovative works from upstream, automatic test equipment (ATE); middle stream, 2.3D/2.5D; and downstream, statistical analysis of…”
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    Conference Proceeding
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    TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning by Huang, Andrew Yi-Ann, Li, Katherine Shu-Min, Tsai, Cheng-Yen, Cheng, Ken Chau-Cheung, Wang, Sying-Jyan, Jiang, Xu-Hao, Chou, Leon, Lee, Chen-Shiun

    “…Wafer defect maps exhibit spatial failure pattern recognition for root cause analysis to improve defect diagnosis resolution and yield learning conventionally…”
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    Conference Proceeding
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    PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques by Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Chou, Leon, Chen, Ken Chau-Cheung, Huang, Andrew Yi-Ann, Wang, Sying-Jyan, Han, Gus Chang-Hung

    Published in 2020 IEEE European Test Symposium (ETS) (01-05-2020)
    “…Wafermap defect pattern detection and diagnosis provide useful clue to yield learning. However, most wafermaps have no special spatial patterns and are full of…”
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    Conference Proceeding
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