Search Results - "Chakraborti, N.B."
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1
An Implementation of Mixed-Radix Conversion for Residue Number Applications
Published in IEEE transactions on computers (01-08-1986)“…A method of residue number system (RNS) conversion to mixed-radix (MR) representation is presented. This method is found to be cost-effective and efficient,…”
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Journal Article -
2
Normal-Mode Parameters of Microstrip Coupled Lines of Unequal Width (Short Paper)
Published in IEEE transactions on microwave theory and techniques (01-02-1984)“…Empirical relations for the capacitive and inductive coupling coefficients have been used to compute normal-mode parameters of non-identical microstrip coupled…”
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Journal Article -
3
Empirical Relations for Capacitive and Inductive Coupling Coefficients of Coupled Microstrip Lines
Published in IEEE transactions on microwave theory and techniques (01-04-1981)“…Empirical relations for inductive and capacitive coupling coefficients are proposed. The functional relationships are based on the physical mechanism of…”
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Journal Article -
4
Noise in multi-heterostructure avalanche photodetectors
Published in 1982 International Electron Devices Meeting (1982)“…The multiplication noise in multiheterostructure avalanche photodetectors has been calculated for different degrees of carrier feedback. For this purpose, a…”
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Conference Proceeding -
5
Generation function in uniformly multiplying avalanche diode
Published in IEEE transactions on electron devices (01-09-1984)“…A simple method of finding generating function in uniformly multiplying avalanche diodes has been presented. Explicit expression for such functions has been…”
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Journal Article -
6
Performance of adaptive filters using combined lattice and transform techniques
Published in Proceedings of the IEEE (1986)“…A composite scheme combining lattice and transform techniques for implementation of adaptive filters is discussed. Results of the eigenvalue spreads and…”
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Journal Article -
7
Enhancement of drain current in vertical SiGe/Si PMOS transistors using novel CMOS technology
Published in 1997 55th Annual Device Research Conference Digest (1997)“…CMOS devices are being scaled for density and speed. However, scaling gate length is impeded by lithographic technology and scaling device width is limited by…”
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Conference Proceeding