Search Results - "Chaar, J.K."

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  1. 1

    Orthogonal defect classification-a concept for in-process measurements by Chillarege, R., Bhandari, I.S., Chaar, J.K., Halliday, M.J., Moebus, D.S., Ray, B.K., Wong, M.-Y.

    Published in IEEE transactions on software engineering (01-11-1992)
    “…Orthogonal defect classification (ODC), a concept that enables in-process feedback to software developers by extracting signatures on the development process…”
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    Journal Article
  2. 2

    Cyclic job shop scheduling using reservation tables by Chaar, J.K., Davidson, E.S.

    “…The use of the reservation table technique to create optimal cyclic schedules is explored. A detailed discussion and analyses are presented of the properties…”
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    Conference Proceeding
  3. 3

    An integrated approach to developing manufacturing control software by Chaar, J.K., Volz, R.A., Davidson, E.S.

    “…An integrated approach to developing the control software for efficient and dependable manufacturing systems is presented. The formal model of a manufacturing…”
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    Conference Proceeding
  4. 4

    In-process evaluation for software inspection and test by Chaar, J.K., Halliday, M.J., Bhandari, I.S., Chillarege, R.

    Published in IEEE transactions on software engineering (01-11-1993)
    “…The goal of software inspection and test is to reduce the expected cost of software failure over the life of a product. The authors extend the use of defect…”
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    Journal Article
  5. 5

    The design and implementation of the control and integration software of a flexible manufacturing system by HadjAlouane, N.B., Chaar, J.K., Naylor, A.W.

    “…The concepts of a methodology for designing and implementing the control and integration software of computer-integrated manufacturing systems are presented…”
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    Conference Proceeding
  6. 6

    On the evaluation of software inspections and tests by Chaar, J.K., Halliday, M.J., Bhandari, I.S., Chillarege, R.

    “…The goal of software inspections and tests is to reduce the expected cost of software failure over the life of a product. This paper extends the use of defect…”
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    Conference Proceeding