Search Results - "Cetronio, Antonio"

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  1. 1

    Silicon carbide for high resolution X-ray detectors operating up to 100°C by Bertuccio, Giuseppe, Casiraghi, Roberto, Cetronio, Antonio, Lanzieri, Claudio, Nava, Filippo

    “…This work presents experimental results on the possibility of high resolution X-ray spectroscopy in a wide temperature range, from room temperature up to 100°C…”
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    Journal Article
  2. 2

    Localized Damage in AlGaN/GaN HEMTs Induced by Reverse-Bias Testing by Zanoni, E., Danesin, F., Meneghini, M., Cetronio, A., Lanzieri, C., Peroni, M., Meneghesso, G.

    Published in IEEE electron device letters (01-05-2009)
    “…Reverse-bias testing in AlGaN/GaN HEMTs at high (negative) gate voltage is found to induce a catastrophic increase in gate leakage current I G , with only a…”
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    Journal Article
  3. 3

    A new generation of X-ray detectors based on silicon carbide by Bertuccio, Giuseppe, Casiraghi, Roberto, Cetronio, Antonio, Lanzieri, Claudio, Nava, Filippo

    “…We present experimental results on X-ray detectors based on Silicon Carbide (SiC). We demonstrate that SiC allows operating the detectors in a wide temperature…”
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    Journal Article
  4. 4
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    Thermal storage effects on AlGaN/GaN HEMT by Danesin, Francesca, Tazzoli, Augusto, Zanon, Franco, Meneghesso, Gaudenzio, Zanoni, Enrico, Cetronio, Antonio, Lanzieri, Claudio, Lavanga, Simone, Peroni, Marco, Romanini, Paolo

    Published in Microelectronics and reliability (01-08-2008)
    “…The effects of thermal storage on GaN–HEMT devices grown on SiC substrate have been investigated by DC and pulsed electrical measurements, breakdown…”
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    Journal Article Conference Proceeding
  6. 6

    High power GaN-HEMT SPDT switches for microwave applications by Bettidi, Andrea, Cetronio, Antonio, Ciccognani, Walter, De Dominicis, Marco, Lanzieri, Claudio, Limiti, Ernesto, Manna, Antonio, Peroni, Marco, Proietti, Claudio, Romanini, Paolo

    “…In this article, the design, fabrication, and on‐wafer test of X‐Band and 2–18 GHz wideband high‐power SPDT MMIC switches in AlGaN/GaN technology are…”
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    Journal Article
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  9. 9

    Integrated HEMT-based charge amplifier-design and experiment by Arnaboldi, C., Guazzoni, C., Longoni, A., Pessina, G., Cetronio, A.

    Published in IEEE TRANS NUCL SCI (01-06-2001)
    “…We have designed and tested a fully integrated high electron mobility transistor (HEMT)-based charge amplifier suitable for applications in high-energy physics…”
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    Journal Article Conference Proceeding
  10. 10

    Critical analysis of results for a european GaN power amplifier after first iteration by Gonzalez-Garrido, M.-A., Grajal, J., Cetronio, A., Marescialli, L.

    “…This paper presents the results of the development of 2-6 GHz broadband high-power amplifiers (HPA) within the 1 st iteration of the European Korrigan project…”
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    Conference Proceeding
  11. 11

    2-6 GHz GaN MMIC Power Amplifiers for Electronic Warfare Applications by Gonzalez-Garrido, M.A., Grajal, J., Cubilla, P., Cetronio, A., Lanzieri, C., Uren, M.

    “…This paper presents two MMIC broadband high power amplifiers of 4 mm of periphery at the output stage in the frequency band 2-6 GHz. The amplifiers are based…”
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    Conference Proceeding
  12. 12

    Gate technology and substrate property influence on GaN HEMT switch device performance by Pantellini, A., Peroni, M., Nanni, A., Cetronio, A., Bettidi, A., Giovine, E.

    “…This work illustrates a study on GaN HEMT switch RF performances dependence on material and fabrication technology. For said study different gate technologies…”
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    Conference Proceeding
  13. 13

    Large-Signal Modeling of Power GaN HEMTs Including Thermal Effects by Torregrosa, G., Grajal, J., Peroni, M., Serino, A., Nanni, A., Cetronio, A.

    “…In this paper a procedure to extract temperature dependent equivalent circuits for modeling the small and large signal behavior of GaN HEMTs is presented. The…”
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    Conference Proceeding
  14. 14

    Long-term stability of Gallium Nitride High Electron Mobility Transistors: a reliability physics approach by Zanoni, E., Meneghesso, G., Meneghini, M., Tazzoli, A., Ronchi, N., Stocco, A., Zanon, F., Chini, A., Verzellesi, G., Cetronio, A., Lanzieri, C., Peroni, M.

    “…Several groups have demonstrated nitride-based High Electron Mobility Transistors with excellent rf output power, with a constant increase in performances…”
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    Conference Proceeding