Search Results - "Caurel, E. Garcia"
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Depolarizing Mueller matrices: how to decompose them?
Published in Physica status solidi. A, Applications and materials science (01-04-2008)“…The various decompositions of depolarizing Mueller matrices into products of basic optical devices, i.e. retarders, diattenuators and depolarizers, are…”
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2
Increasing signal-to-noise ratio in over-determined Mueller matrices
Published in Optics express (31-07-2023)“…This work investigates how the signal-to-noise ratio (SNR) of an over-determined Mueller matrix can be improved by changing the method of calculation…”
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3
Bright Singularities: Polarimetric Calibration of Spaceborne PolSAR Systems
Published in IEEE geoscience and remote sensing letters (01-03-2021)“…In this letter, we present a new algorithm for the polarimetric calibration of spaceborne imaging radar systems. The technique combines two features: first, a…”
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4
Polarimetric characterization of optically anisotropic flexible substrates
Published in Thin solid films (15-02-2008)“…Phase Modulated Spectroscopic Ellipsometry as well as Liquid Crystal Mueller Matrix Polarimetry in reflection and in transmission configurations were used to…”
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Journal Article Conference Proceeding -
5
Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry
Published in Physica status solidi. A, Applications and materials science (01-04-2008)“…In this work we characterized two bidimensional gratings consisting each of a square array of square holes etched in a photoresist layer deposited on silicon…”
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6
Conservation of the piezoelectric response of PVDF films under irradiation
Published in Radiation physics and chemistry (Oxford, England : 1993) (01-01-2018)“…As opposed to piezo-ceramics (i.e PZT), flexibility and robustness characterize piezoelectric polymers. The main advantage of a piezoelectric polymer, such as…”
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7
Sum decomposition of Mueller-matrix images and spectra of beetle cuticles
Published in Optics express (09-02-2015)“…Spectral Mueller matrices measured at multiple angles of incidence as well as Mueller matrix images are recorded on the exoskeletons (cuticles) of the scarab…”
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8
Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices
Published in Optics express (20-07-2009)“…The measurement of the Mueller matrix when the probing beam is placed on the boundary between two (or more) regions of the sample with different optical…”
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9
Spectroscopic Mueller polarimeter based on liquid crystal devices
Published in Thin solid films (01-05-2004)“…A new spectroscopic Mueller matrix polarimeter based on liquid crystal devices is presented. Fast spectroscopic measurements (approx. 1 s) of a complete…”
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10
Characterization of grating structures by Mueller polarimetry in presence of strong depolarization due to finite spot size
Published in Optics communications (01-03-2009)“…In this paper, we present an approach based on Mueller polarimetry for dimensional characterization of periodic structures with sample sizes smaller than the…”
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11
General methods for optimized design and calibration of Mueller polarimeters
Published in Thin solid films (01-05-2004)“…A Mueller polarimeter always comprises a polarization state generator (PSG) and a polarization state analyzer (PSA), whose configurations determine the…”
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12
Workshop on advanced polarimetric instrumentation: API’09
Published in EPJ Web of conferences (01-06-2010)“…The First NanoCharM Workshop on Advanced Polarimetric Instrumentation was focused on the instrumentation developed to work with polarised light, which is the…”
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13
Design and characterization of achromatic 132° retarders in CaF2 and fused silica
Published in Journal of modern optics (10-08-2008)“…Mueller matrix ellipsometers (MMEs) are known to be less affected by noise if the compensators have a 132° phase shift between the slow and fast axis. This…”
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14
Wide-band reflection nanoporous silicon multilayers with ellipsometric investigation of the material monolayer components
Published in Materials science & engineering. B, Solid-state materials for advanced technology (15-02-2008)“…Two multilayer structures made of nanoporous silicon layers are designed, fabricated and characterized. The layers that form the structures are characterized…”
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15
Study of the Optical and Structural Properties of Silicon-Carbon Nanometric Powder Using Infrared Phase Modulated Ellipsometry and Electron Microscopy
Published in Physica status solidi. A, Applied research (01-09-1999)“…Hydrogenated amorphous silicon–carbon (a‐SiC : H) nanometric powder was produced in an rf plasma of SiH4 and CH4. Particle size, composition and powder yield…”
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16
Characterization of photonic structures using visible and infrared polarimetry
Published in EPJ Web of conferences (01-01-2010)“…Photonic Crystals are materials with a spatial periodic variation of the refractive index on the wavelength scale. This confers these materials interesting…”
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17
Polarimetric analysis of a fused sphere as a model for adherent particles
Published in Optik (Stuttgart) (01-04-2020)“…There are many situations of interest that are related to the geometry of soft spherical particles close – and adhering – to a surface. The case of biological…”
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18
Characterization of vine, Vitis vinifera, leaves by Mueller polarimetric microscopy
Published in Thin solid films (01-01-2023)“…•Mueller microscopy is a robust and reliable technique to study vegetal tissues.•Mueller microscopy does not require complex sample preparation.•We studied…”
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19
Optimized calibration method for Fourier transform infrared phase-modulated ellipsometry
Published in Thin solid films (08-10-1999)“…A new calibration method for FTIR phase-modulated ellipsometry is presented. This procedure is based on the multiple-harmonic modulation model and takes into…”
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20
Stability under electron irradiation of some layered hydrated minerals
Published in Journal of solid state chemistry (01-12-2024)“…The structural damages caused to some layered hydrated minerals by 2.5 MeV electron irradiation using the SIRIUS platform were studied by powder X-Ray…”
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