Positive and negative ion emission from perfluorinated poly-ethers

Positive and negative ion ejection in the mass range below 200 Dalton is observed for perfluorinated poly-ether surfaces subjected to electron- and ion-beam irradiation. The exciting projectiles are Ar + ions of 300 and 4000 eV and electrons of 3000 eV. The main positive ions found are fragments of...

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Bibliographic Details
Published in:Chemical physics letters Vol. 336; no. 5; pp. 431 - 438
Main Authors: Lourenço, J.M.C., Carrapa, R.T., Teodoro, O.M.N., Moutinho, A.M.C., Gleeson, M.A., Los, J., Kleyn, A.W.
Format: Journal Article
Language:English
Published: Amsterdam Elsevier B.V 23-03-2001
Elsevier Science
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Summary:Positive and negative ion ejection in the mass range below 200 Dalton is observed for perfluorinated poly-ether surfaces subjected to electron- and ion-beam irradiation. The exciting projectiles are Ar + ions of 300 and 4000 eV and electrons of 3000 eV. The main positive ions found are fragments of CF 3 + ions. Larger ions are found with lower probability. The main negative ion observed is F. The results show that the liquid–vacuum interface is formed by CF 3 groups from the polymer.
ISSN:0009-2614
1873-4448
DOI:10.1016/S0009-2614(01)00119-1