Search Results - "Cardon, F."
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A BEEM study of the temperature dependence of the barrier height distribution in PtSi/n-Si Schottky diodes
Published in Solid state communications (01-10-1999)“…Schottky barrier height distributions of a PtSi film on n-Si(100) are directly measured by ballistic electron emission spectroscopy at temperatures ranging…”
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Influence of Ti on CoSi2 nucleation
Published in Applied physics letters (13-11-2000)“…Evidence is presented that impurities present in the precursor phase may influence the nucleation of a new phase. In case of the CoSi→CoSi2 transition, it is…”
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Electrical characteristics of CoSi2/n-Si(100) Schottky barrier contacts formed by solid state reaction
Published in Solid-state electronics (01-10-2000)Get full text
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CoSi2 formation through SiO2
Published in Thin solid films (01-05-2001)Get full text
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CoSi2 nucleation in the presence of Ge
Published in Thin solid films (15-03-2001)Get full text
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The influence of Ti capping layers on CoSi2 formation
Published in Microelectronic engineering (2000)Get full text
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A detailed XPS study of the rare earth compounds EuS and EuF3
Published in Journal of electron spectroscopy and related phenomena (14-09-1995)Get full text
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Intérêt de la neurocryostimulation dans la prise en charge de la douleur post-traumatique en médecine d’urgence
Published in Annales françaises de médecine d'urgence (2014)“…Résumé Objectifs Cette étude a été réalisée afin d’évaluer l’effet antalgique de la neurocryostimulation (NCS) sur les douleurs post-traumatiques en médecine…”
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An XPS study of the dopants' valence states and the composition of CaS1 − xSex:Eu and SrS1 − xSex:Ce thin film electroluminescent devices
Published in Journal of luminescence (01-01-1995)Get full text
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Photoluminescence of SrS:Cu, Ag and SrS1-xSex:Cu, Ag thin films
Published in Solid state communications (01-01-2000)Get full text
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The dependence of the etching property of CoSi 2 films in diluted HF solutions on the formation conditions
Published in Applied surface science (02-07-2001)“…Three series of CoSi 2 thin films which were fabricated by solid state reaction of evaporated Co, Ti/Co and Co/Ti on p-type Si (1 0 0) substrates with…”
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Optical characterisation of SrS : Cu and SrS : Cu,Ag EL devices
Published in Journal of luminescence (01-09-2000)“…The electroluminescent behaviour of SrS:Cu and SrS:Cu,Ag electron beam evaporated EL devices was investigated. Using time-resolved optical measurements at 15K…”
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First-line Raltegravir/Emtricitabine/Tenofovir Combination in Human Immunodeficiency Virus Type 2 (HIV-2) Infection: A Phase 2, Noncomparative Trial (ANRS 159 HIV-2)
Published in Clinical infectious diseases (28-09-2018)“…First-line raltegravir-containing combination antiretroviral therapy in 30 patients living with HIV-2 was well tolerated and yielded a median CD4 gain at 1…”
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Forearm arteries entrapment syndrome: A rare cause of recurrent angioaccess thrombosis
Published in Journal of vascular surgery (01-10-2001)“…Entrapment syndrome below or just above the elbow is uncommon. These rare causes of neurologic or vascular entrapment are linked to anomalous anatomical…”
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Intrinsic optical and structural properties of SrS thin films
Published in Thin solid films (15-08-1999)“…SrS thin films were deposited by electron beam evaporation on heated silica substrates. The optical properties of the layers – complex refractive index and…”
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Influence of the growth conditions on the properties of CaS:Eu electroluminescent thin films
Published in Journal of luminescence (01-09-1997)“…A detailed study of the structural, compositional and optical properties of electron beam deposited CaS:Eu electroluminescent devices is presented. Specific…”
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Effects of rapid thermal annealing on electron beam evaporated SrS:Ce thin film electroluminescent devices made in H2S ambient
Published in Journal of crystal growth (01-07-1999)Get full text
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Surface and interface morphology of CoSi2 films formed by multilayer solid-state reaction
Published in Materials characterization (01-04-2002)Get full text
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Orientation-dependent stress build-up during the formation of epitaxial CoSi2
Published in Microelectronic engineering (01-03-2001)Get full text
Conference Proceeding Journal Article