Search Results - "Cappella, B."

Force-distance curves by atomic force microscopy by Cappella, B., Dietler, G.

“…Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials…”
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Comparison of nanoindentation and AFM methods for the determination of mechanical properties of polymers by Griepentrog, M., Krämer, G., Cappella, B.

“…Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the…”
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Exploring quantitative cellular bioimaging and assessment of CdSe/ZnS quantum dots cellular uptake in single cells, using ns-LA-ICP-SFMS by Pisonero, J., Traub, H., Cappella, B., Álvarez-Llamas, C., Méndez, A., Richter, S., Encinar, J. Ruiz, Costa-Fernandez, J.M., Bordel, N.

“…Quantitative bioimaging of Quantum Dots (QDs) uptake in single cells by laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is a…”
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Nanomechanical properties of polymer thin films measured by force–distance curves by Cappella, B., Silbernagl, D.

“…Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly( n-butyl methacrylate) on glass substrates…”
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Using AFM Force−Distance Curves To Study the Glass-to-Rubber Transition of Amorphous Polymers and Their Elastic−Plastic Properties as a Function of Temperature by Cappella, B, Kaliappan, S. K, Sturm, H

“…Force−displacement curves have been obtained with a commercial atomic force microscope (AFM) at different temperatures and probe rates on a thick film of…”
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Nanomechanical Properties of Mechanical Double-Layers:  A Novel Semiempirical Analysis by Cappella, B, Silbernagl, D

“…Force−displacement curves have been acquired with a commercial atomic force microscope on a thin film of poly(n-butyl methacrylate) on glass substrates. The…”
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Adhesion of amorphous polymers as a function of temperature probed with AFM force–distance curves by Cappella, B., Stark, W.

“…Force–displacement curves have been obtained with a commercial atomic force microscope at different temperatures and probe rates on a thick film of poly(…”
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Reconstruction of a hidden topography by single AFM force–distance curves by Silbernagl, D., Cappella, B.

“…Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a…”
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Influence of Film−Substrate Adhesion on the Mechanical Properties of Thin Polymer Films by Silbernagl, D, Sturm, H, Cappella, B

“…The mechanical properties of mechanical double layers (thin amorphous films of poly(n-butyl methacrylate) on considerably stiffer silicon substrates) were…”
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Local Mechanical Properties of Plasma Treated Polystyrene Surfaces by Bonaccurso, E, Cappella, B, Graf, K

“…We study how a local air plasma treatment affects the mechanical properties of polystyrene by performing indentation measurements on the polymer in the elastic…”
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Breaking polymer chains by dynamic plowing lithography by Cappella, B, Sturm, H, Weidner, S.M

“…The adhesion of poly(methyl methacrylate) (PMMA) and polystyrene (PS) films, whose surface has been previously structured by dynamic plowing lithography (DPL),…”
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Dislocation of antimony clusters on graphite by means of dynamic plowing nanolithography by Heyde, M., Cappella, B., Sturm, H., Ritter, C., Rademann, K.

“…Antimony clusters of different shapes and dimensions have been obtained by evaporating antimony on graphite. The dependence of the shape and dimensions of the…”
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Force measurements with the atomic force microscope: Technique, interpretation and applications by Butt, Hans-Jürgen, Cappella, Brunero, Kappl, Michael

“…The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure…”
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Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves by Cappella, B., Sturm, H., Schulz, E.

“…Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different…”
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Structure and Nanomechanical Properties of Solvent Cast Stearic Acid Films in Liquid:  An Atomic Force Microscopy Study by Cappella, B, Baschieri, P, Ruffa, M, Ascoli, C, Relini, A, Rolandi, R

“…Solvent-cast stearic acid samples have been studied by using atomic force microscopy to inspect surface topography and measure tip−sample interactions…”
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Calibrating a high-speed contact-resonance profilometer by Fahrbach, Michael, Friedrich, Sebastian, Cappella, Brunero, Peiner, Erwin

“…A European EMPIR project, which aims to use large-scale, 5 mm × 200 µm × 50 µm (L×W×H), piezoresistive microprobes for contact resonance applications, a…”
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Temperature dependent elastic–plastic behaviour of polystyrene studied using AFM force–distance curves by Kaliappan, Senthil Kumar, Cappella, Brunero

“…Force–displacement curves have been obtained on two polystyrene samples, having different molecular weight, at various temperatures and probe rates using an…”
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Force-distance curves by AFM by Cappella, B., Baschieri, P., Frediani, C., Miccoli, P., Ascoli, C.

“…Since 1989, the atomic force microscope (AFM) has emerged as a useful tool in studying surface interactions by means of force-distance curves, and a great deal…”
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Time Estimation by Hyperactive and Normal Children by Cappella, Betty, Gentile, J. Ronald, Juliano, Daniel B.

“…In two studies [a pilot (12 7- to 10-yr.-olds) and a main study (100 8- to 12-yr.-olds)] hyperactive and normal children were compared on the ability to…”
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Stiffness and adhesion characterization of nanolithographed poly(methyl methacrylate) by means of force-displacement curves: Application of scanning probe microscopy in interfacial phenomena (Part II) by CAPPELLA, B, STURM, H, SCHULZ, E

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