Search Results - "Campola, Michael"

A Confidence-Based Approach to Include Survivors in a Probabilistic TID Failure Assessment by Champagne, Chloe A., Sierawski, Brian D., Ladbury, Raymond L., Campola, Michael J., Fleetwood, Daniel M.

“…A probabilistic total ionizing dose (TID) failure assessment is extended to include survivor data, enabling the bounding of failure probability to a desired…”
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Incorporating Component-Level Testing into Bayesian Degradation Distributions to Estimate a Voltage Regulator's Radiation Failure Probabilities by Nederlander, Richard H., Witulski, Arthur F., Reed, Robert A., Karsai, Gabor, Ladbury, Ray L., Zhang, En Xia, Schrimpf, Ronald D., Ryder, Kaitlyn L., Campola, Michael J., Mahadevan, Nag, Austin, Rebekah A., Sierawski, Brian D.

“…Device-level failure probabilities derived from historical, similar radiation datasets can be inputted into a system-level radiation reliability model to…”
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A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash by Wilcox, Edward P., Campola, Michael J.

“…Single-event effects and total ionizing dose testing are described for a 32-layer NAND flash memory, in both SLC and MLC configurations, with special…”
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Single-Event Transient Case Study for System-Level Radiation Effects Analysis by Campola, Michael J., Austin, Rebekah A., Wilcox, Edward P., Kim, Hak S., Ladbury, Raymond L., Label, Kenneth A., Pellish, Jonathan A.

“…Analog single-event transient (SET) results are analyzed for two different applications within one system architecture. Application-specific analyses are…”
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An Examination of the Radiation Sensitivity of Electronic Display Pixel Technologies by Ryder, Landen D., Wyrwas, Edward J., Cisneros, Geraldo A., Bautista, Justin R., Xu, Xiaojing, Garrett, Tyler M., Campola, Michael J., Gaza, Razvan

“…64 MeV proton irradiation test campaigns were conducted on pixel technologies that span the range of commercially available electronic displays for crewed…”
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BJTs in Space: ELDRS Experiment on NASA Space Environment Testbed by Benedetto, A. R., Barnaby, H. J., Cook, Cheyenne, Campola, Michael J., Tender, Anna

“…Flight data on bipolar junction transistors (BJTs) are recorded and the effects of low dose rate space irradiation on BJTs are characterized, leading to…”
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Failure Analysis of Heavy Ion-Irradiated Schottky Diodes by Casey, Megan C., Lauenstein, Jean-Marie, Weachock, Ronald J., Wilcox, Edward P., Hua, Lang M., Campola, Michael J., Topper, Alyson D., Ladbury, Raymond L., LaBel, Kenneth A.

“…In this paper, we use high- and low-magnification optical microscope images, thermal infrared camera images, and scanning electron microscope images to…”
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NASA Goddard Space Flight Center's Current Radiation Effects Test Results by O'Bryan, Martha V., Wilcox, Edward P., Carstens, Thomas A., Ryder, Kaitlyn L., Barth, Jonathan D., Osheroff, Jason M., Ryder, Landen D., Casey, Megan C., Joplin, Matthew B., Lauenstein, Jean-Marie, LaBel, Kenneth A., Campola, Michael J., Wyrwas, Edward J., Antonsanti, Aubin P., Berg, Melanie D., Cochran, Donna J., Majewicz, Peter J., Pellish, Jonathan A.

“…We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single…”
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NASA Goddard Space Flight Center's Recent Radiation Effects Test Results by Topper, Alyson D., O'Bryan, Martha V., Wilcox, Edward P., Carstens, Thomas A., Barth, Jonathan D., Berg, Melanie, Casey, Megan C., Joplin, Matthew B., Lauenstein, Jean-Marie, Campola, Michael J., Cochran, Donna J., Pellish, Jonathan A., Majewicz, Peter J.

“…Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate…”
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Vision System for the Mars Sample Return Capture Containment and Return System (CCRS) by Bos, Brent J., Donovan, David L., Capone, John I., Wang, Chen, Hardwick, Terra C., Bell, Dylan E., Zhu, Yuqing, Podgurski, Robert, Rizk, Bashar, Orlowski, Ireneusz, Edison, Rachel A., Harvey, David A., Dizon, Brianna, Haseltine, Lindsay, Olsen, Kristoffer C., Sheng, Chad, Bousquet, Robert R., Vo, Luan Q., Georgiev, Georgi T., Washington, Kristen A., Singer, Michael J., Ioana, Stefan, Le, Anloc H., Georgieva, Elena M., Hackett, Michael T., Ravine, Michael A., Caplinger, Michael, Coulter, Phillip, Percy, Erin, Torisky, Charles, Lauenstein, Jean-Marie, Ryder, Kaitlyn L., Campola, Michael J., Johnstone, Dillon E., Thomes, William J., Schnurr, Richard G., McCloskey, John C., De Marco, Eugenia L., Lee, Ellen, Yew, Calinda M., Yang, Bo, Han, Mingyu, Blonski, Bartosz

“…The successful 2020 launch and 2021 landing of the National Aeronautics and Space Administration’s (NASA) Perseverance Mars rover initiated the first phase of…”
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Systems Engineering and Assurance Modeling (SEAM): A Web-Based Solution for Integrated Mission Assurance by Ryder, K L, Alles, R, Karsai, G, Mahadevan, N, Evans, J, Witulski, A F, Campola, M, Austin, R, Schrimpf, R

“…We present an overview of the Systems Engineering and Assurance Modeling (SEAM) platform, a web-browser-based tool which is designed to help engineers evaluate…”
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NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results by Topper, Alyson D., Lauenstein, Jean-Marie, Wilcox, Edward P., Berg, Melanie D., Campola, Michael J., Casey, Megan C., Wyrwas, Edward J., O'Bryan, Martha V., Carstens, Thomas A., Fedele, Caroline M., Forney, James D., Kim, Hak S., Osheroff, Jason M., Phan, Anthony M., Chaiken, Max F., Cochran, Donna J., Pellish, Jonathan A., Majewicz, Peter J.

“…Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate…”
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NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results by Topper, Alyson D., Wilcox, Edward P., Casey, Megan C., Campola, Michael J., Burton, Noah D., LaBel, Kenneth A., Cochran, Donna J., O'Bryan, Martha V.

“…Total ionizing dose and displacement damage testing were performed to characterize and determine the suitability of candidate electronics for NASA space…”
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NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results by O'Bryan, Martha V., LaBel, Kenneth A., Wilcox, Edward P., Dakai Chen, Wyrwas, Edward J., Campola, Michael J., Casey, Megan C., Lauenstein, Jean-Marie, Topper, Alyson D., Szabo, Carl M., Pellish, Jonathan A., Berg, Melanie D., Lewellen, John W., Holloway, Michael A.

“…We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of…”
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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions by Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.

“…Direct ionization from low energy protons is shown to cause upsets in a 65-nm bulk CMOS SRAM, consistent with results reported for other deep submicron…”
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Heavy Ion Testing With Iron at 1 GeV/amu by Pellish, Jonathan A, Xapsos, Michael A, LaBel, Kenneth A, Marshall, Paul W, Heidel, David F, Rodbell, Kenneth P, Hakey, Mark C, Dodd, Paul E, Shaneyfelt, Marty R, Schwank, James R, Baumann, Robert C, Xiaowei Deng, Marshall, Andrew, Sierawski, Brian D, Black, Jeffrey D, Reed, Robert A, Schrimpf, Ronald D, Kim, Hak S, Berg, Melanie D, Campola, Michael J, Friendlich, Mark R, Perez, Christopher E, Phan, Anthony M, Seidleck, Christina M

“…A 1 GeV/amu 56 Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy…”
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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs by Tipton, A.D., Pellish, J.A., Hutson, J.M., Baumann, R., Deng, X., Marshall, A., Xapsos, M.A., Kim, H.S., Friendlich, M.R., Campola, M.J., Seidleck, C.M., LaBel, K.A., Mendenhall, M.H., Reed, R.A., Schrimpf, R.D., Weller, R.A., Black, J.D.

“…The effects of device orientation on heavy ion-induced multiple-bit upset (MBU) in 65 nm SRAMs are examined. The MBU response is shown to depend on the…”
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In-Flight Demonstration of Enhanced-Low-Dose-Rate-Sensitivity (ELDRS) in Bipolar Junction Transistors by Benedetto, A. R., Barnaby, H. J., Cook, Cheyenne, Campola, Michael J., Tender, Anna

“…Data on bipolar junction transistors (BJTs) acquired from an in-flight mission experiment are recorded and downloaded for analysis. These data are analyzed for…”
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Single Event Effects Testing of a Vertical Optocoupler with Unmodified Packaging by Ryder, Landen D., Carstens, Thomas A., Phan, Anthony M., Seidlick, Christina M., Campola, Michael J.

“…Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show…”
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A Confidence-Based Approach to Including Survivors in a Probabilistic TID Failure Assessment by Champagne, Chloe A., Sierawski, Brian D., Ladbury, Raymond L., Campola, Michael J., Fleetwood, Daniel M.

“…A probabilistic total ionizing dose (TID) failure assessment is extended to include survivor data, enabling the bounding of failure probability to a desired…”
Get full text