Search Results - "Camillo, Yori G"

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  1. 1

    Statistical modeling of epitaxial thin films of an intrinsic antiferromagnetic topological insulator by Penacchio, Rafaela F.S., Fornari, Celso I., Camillo, Yorí G., Kagerer, Philipp, Buchberger, Sebastian, Kamp, Martin, Bentmann, Hendrik, Reinert, Friedrich, Morelhão, Sérgio L.

    Published in Thin solid films (31-05-2022)
    “…•Epitaxial growth of an intrinsic antiferromagnetic topological insulator (TI).•Accessible information for structural analysis of MnxBi2Te3+x thin…”
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    Journal Article
  2. 2

    Simulation of X-ray diffraction in Mn$_x$Bi$_2$Te$_{3+x}$ epitaxic films by Penacchio, Rafaela F. S, Fornari, Celso I, Camillo, Yori G, Kagerer, Philipp, Buchberger, Sebastian, Kamp, Martin, Bentmann, Hendrik, Reinert, Friedrich, Morelhao, Sergio L

    Published 04-09-2021
    “…Disordered heterostructures stand as a general description for compounds that are part of homologous series such as bismuth chalcogenides. In device…”
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    Journal Article
  3. 3

    X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator by Penacchio, Rafaela F. S, Fornari, Celso I, Camillo, Yori G, Kagerer, Philipp, Buchberger, Sebastian, Kamp, Martin, Bentmann, Hendrik, Reinert, Friedrich, Morelhao, Sergio L

    Published 26-07-2021
    “…Synthesis of new materials demands structural analysis tools suited to the particularities of each system. Van der Waals (vdW) materials are fundamental in…”
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    Journal Article