Abundance and depth of origin of neutral and ionic clusters sputtered from a liquid gallium-indium eutectic alloy

Neutral and positively charged clusters produced by 4 keV Ar[sup +] ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon positionization of the neutrals. The abundence distributions for clusters with equal nucleari...

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Bibliographic Details
Published in:	Physical review letters Vol. 73; no. 12; pp. 1719 - 1722
Main Authors:	Lill, TB, Callaway, WF, Pellin, MJ, Gruen, DM
Format:	Journal Article
Language:	English
Published:	United States 19-09-1994
Subjects:	665300 - Interactions Between Beams & Condensed Matter- (1992-) 70 PLASMA PHYSICS AND FUSION TECHNOLOGY 700350 - Plasma Production, Heating, Current Drive, & Interactions- (1992-) ALLOY SYSTEMS ALLOYS ARGON IONS ATOMIC CLUSTERS BEAMS BINARY ALLOY SYSTEMS CHARGE STATES CHARGED PARTICLES CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ENERGY RANGE FLUIDS GALLIUM ALLOYS INDIUM ALLOYS ION BEAMS IONS KEV RANGE KEV RANGE 01-10 LIQUIDS MASS SPECTRA SPECTRA SPUTTERING TIME-OF-FLIGHT METHOD
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Summary:	Neutral and positively charged clusters produced by 4 keV Ar[sup +] ion bombardment of a liquid gallium-indium eutectic alloy have been studied by time-of-flight mass spectrometry coupled with single photon positionization of the neutrals. The abundence distributions for clusters with equal nuclearity are statistical. They confirm a strong indium surface segregation. An increasing gallium content and therefore larger depth of origin, was found for increasing cluster size.
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 W-31109-ENG-38
ISSN:	0031-9007 1079-7114
DOI:	10.1103/PhysRevLett.73.1719