Search Results - "CIHELKA, J"

Spot size characterization of focused non-Gaussian X-ray laser beams by Chalupský, J, Krzywinski, J, Juha, L, Hájková, V, Cihelka, J, Burian, T, Vysín, L, Gaudin, J, Gleeson, A, Jurek, M, Khorsand, A R, Klinger, D, Wabnitz, H, Sobierajski, R, Störmer, M, Tiedtke, K, Toleikis, S

“…We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the…”
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Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids by Chalupský, J, Juha, L, Kuba, J, Cihelka, J, Hájková, V, Koptyaev, S, Krása, J, Velyhan, A, Bergh, M, Caleman, C, Hajdu, J, Bionta, R M, Chapman, H, Hau-Riege, S P, London, R A, Jurek, M, Krzywinski, J, Nietubyc, R, Pelka, J B, Sobierajski, R, Meyer-Ter-Vehn, J, Tronnier, A, Sokolowski-Tinten, K, Stojanovic, N, Tiedtke, K, Toleikis, S, Tschentscher, T, Wabnitz, H, Zastrau, U

“…A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at…”
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Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure by Khorsand, A R, Sobierajski, R, Louis, E, Bruijn, S, van Hattum, E D, van de Kruijs, R W E, Jurek, M, Klinger, D, Pelka, J B, Juha, L, Burian, T, Chalupsky, J, Cihelka, J, Hajkova, V, Vysin, L, Jastrow, U, Stojanovic, N, Toleikis, S, Wabnitz, H, Tiedtke, K, Sokolowski-Tinten, K, Shymanovich, U, Krzywinski, J, Hau-Riege, S, London, R, Gleeson, A, Gullikson, E M, Bijkerk, F

“…We investigated single shot damage of Mo/Si multilayer coatings exposed to the intense fs XUV radiation at the Free-electron LASer facility in Hamburg - FLASH…”
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Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses by Chalupský, J, Juha, L, Hájková, V, Cihelka, J, Vysín, L, Gautier, J, Hajdu, J, Hau-Riege, S P, Jurek, M, Krzywinski, J, London, R A, Papalazarou, E, Pelka, J B, Rey, G, Sebban, S, Sobierajski, R, Stojanovic, N, Tiedtke, K, Toleikis, S, Tschentscher, T, Valentin, C, Wabnitz, H, Zeitoun, P

“…We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly (methyl…”
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Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources by Sobierajski, R, Bruijn, S, Khorsand, A R, Louis, E, van de Kruijs, R W E, Burian, T, Chalupsky, J, Cihelka, J, Gleeson, A, Grzonka, J, Gullikson, E M, Hajkova, V, Hau-Riege, S, Juha, L, Jurek, M, Klinger, D, Krzywinski, J, London, R, Pelka, J B, Płociński, T, Rasiński, M, Tiedtke, K, Toleikis, S, Vysin, L, Wabnitz, H, Bijkerk, F

“…We investigated the damage mechanism of MoN/SiN multilayer XUV optics under two extreme conditions: thermal annealing and irradiation with single shot intense…”
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Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation by Hau-Riege, S. P., London, R. A., Bionta, R. M., Ryutov, D., Soufli, R., Bajt, S., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Klinger, D., Pelka, J. B., Jurek, M., Juha, L., Chalupský, J., Cihelka, J., Hájková, V., Velyhan, A., Krása, J., Tiedtke, K., Toleikis, S., Wabnitz, H., Bergh, M., Caleman, C., Timneanu, N.

“…We exposed bulk SiC and films of SiC and B 4 C to single 25 fs long free-electron-laser pulses with wavelengths between 13.5 and 32 nm. The materials are…”
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Ablation of solids using a femtosecond extreme ultraviolet free electron laser by Stojanovic, N., von der Linde, D., Sokolowski-Tinten, K., Zastrau, U., Perner, F., Förster, E., Sobierajski, R., Nietubyc, R., Jurek, M., Klinger, D., Pelka, J., Krzywinski, J., Juha, L, Cihelka, J., Velyhan, A., Koptyaev, S., Hajkova, V., Chalupsky, J., Kuba, J., Tschentscher, T., Toleikis, S., Düsterer, S., Redlin, H.

“…The ablation of solids by high energy femtosecond pulses from an extreme ultraviolet (XUV) free electron laser has been investigated using picosecond optical…”
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Diagnostic and characterization of the VCSEL diodes based on GaSb by Matulková, I., Cihelka, J., Vyskočil, J., Zelinger, Z., Hulicius, E., Šimeček, T., Civiš, S.

“…Vertical-Cavity Surface-Emitting Laser (VCSEL) diodes are among the youngest members of the semiconductor laser diode family. The main aim of our work focuses…”
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Room-temperature diode laser photoacoustic spectroscopy near 2.3 μm by CIVIS, S, HORKA, V, ALIBERT, C, WERNER, R, KOETH, J, CIHELKA, J, SIMECEK, T, HULICIUS, E, OSWALD, J, PANGRAC, J, VICET, A, ROUILLARD, Y, SALHI, A

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Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5nm wavelength by Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupský, J., Cihelka, J., Hájková, V., Velyhan, A., Krása, J., Kuba, J., Tiedtke, K., Toleikis, S., Tschentscher, Th, Wabnitz, H., Bergh, M., Caleman, C., Sokolowski-Tinten, K., Stojanovic, N., Zastrau, U.

“…Samples of B4C, amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25fs long pulses of 32.5nm free-electron-laser radiation…”
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Electronic structure of an XUV photogenerated solid-density aluminum plasma by Vinko, S M, Zastrau, U, Mazevet, S, Andreasson, J, Bajt, S, Burian, T, Chalupsky, J, Chapman, H N, Cihelka, J, Doria, D, Döppner, T, Düsterer, S, Dzelzainis, T, Fäustlin, R R, Fortmann, C, Förster, E, Galtier, E, Glenzer, S H, Göde, S, Gregori, G, Hajdu, J, Hajkova, V, Heimann, P A, Irsig, R, Juha, L, Jurek, M, Krzywinski, J, Laarmann, T, Lee, H J, Lee, R W, Li, B, Meiwes-Broer, K-H, Mithen, J P, Nagler, B, Nelson, A J, Przystawik, A, Redmer, R, Riley, D, Rosmej, F, Sobierajski, R, Tavella, F, Thiele, R, Tiggesbäumker, J, Toleikis, S, Tschentscher, T, Vysin, L, Whitcher, T J, White, S, Wark, J S

“…By use of high intensity XUV radiation from the FLASH free-electron laser at DESY, we have created highly excited exotic states of matter in solid-density…”
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Time-resolved Fourier-transform infrared emission spectroscopy of Au in the 1800-4000-cm{sup -1} region: Rydberg transitions by Civis, S., Matulkova, I., Cihelka, J., Kawaguchi, K., Chernov, V. E., Buslov, E. Yu, Faculty of Science, Okayama University, Tsushima-naka, Okayama 700-8530, Voronezh State University, RV-394693 Voronezh

“…Time-resolved Fourier-transform infrared spectroscopy was applied for observations of the emission arising after irradiation of a Au target with a pulsed…”
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Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength by Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupský, J., Cihelka, J., Hájková, V., Velyhan, A., Krása, J., Kuba, J., Tiedtke, K., Toleikis, S., Tschentscher, Th, Wabnitz, H., Bergh, M., Caleman, C., Sokolowski-Tinten, K., Stojanovic, N., Zastrau, U.

“…Samples of B 4 C , amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25 fs long pulses of 32.5 nm free-electron-laser…”
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Soft x-ray free electron laser microfocus for exploring matter under extreme conditions by Nelson, A J, Toleikis, S, Chapman, H, Bajt, S, Krzywinski, J, Chalupsky, J, Juha, L, Cihelka, J, Hajkova, V, Vysin, L, Burian, T, Kozlova, M, Fäustlin, R R, Nagler, B, Vinko, S M, Whitcher, T, Dzelzainis, T, Renner, O, Saksl, K, Khorsand, A R, Heimann, P A, Sobierajski, R, Klinger, D, Jurek, M, Pelka, J, Iwan, B, Andreasson, J, Timneanu, N, Fajardo, M, Wark, J S, Riley, D, Tschentscher, T, Hajdu, J, Lee, R W

“…We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine…”
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Diode laser photoacoustic detection of automobile exhaust emissions by Cihelka, J., Horka, V., Civis, S.

“…A study of the infrared spectra of the CH/sub 4/, NH/sub 3/, N/sub 2/O and ethane gases has been carried out. These molecules are part of atmospheric pollution…”
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Measurement of heat isolating properties of clothing by CIHELKA, J

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Acid phosphates of 1-(1-naphthyl)ethylamine – importance of symmetry relation between enantiomers by Kaman, O., Havlicek, D., Cihelka, J.

“…Abstract only…”
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Damage in solids irradiated by a single shot of XUV free-electron laser: Irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy by Pelka, J.B., Sobierajski, R., Klinger, D., Paszkowicz, W., Krzywinski, J., Jurek, M., Zymierska, D., Wawro, A., Petroutchik, A., Juha, L., Hajkova, V., Cihelka, J., Chalupsky, J., Burian, T., Vysin, L., Toleikis, S., Sokolowski-Tinten, K., Stojanovic, N., Zastrau, U., London, R., Hau-Riege, S., Riekel, C., Davies, R., Burghammer, M., Dynowska, E., Szuszkiewicz, W., Caliebe, W., Nietubyc, R.

“…The article presents preliminary investigation results on the near-surface damage produced by single pulses of XUV free-electron laser in the amorphous α-SiO…”
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Room-temperature diode laser photoacoustic spectroscopy near 2.3 mm by Civis, S, Horka, V, Cihelka, J, Simecek, T, Hulicius, E, Oswald, J, Pangrac, J, Vicet, A, Rouillard, Y, Salhi, A, Alibert, C, Werner, R, Koeth, J

“…We describe results obtained with a new type of GaSb-based semiconductor distributed feedback multiple quantum well lasers operating in continuous-wave mode at…”
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Time-resolved Fourier-transform infrared emission spectroscopy of Au in the 1800 – 4000 − cm − 1 region: Rydberg transitions by Civiš, S., Matulková, I., Cihelka, J., Kawaguchi, K., Chernov, V. E., Buslov, E. Yu

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