Search Results - "CHERNS, D"

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  1. 1

    Oxygen segregation to dislocations in GaN by Hawkridge, M. E., Cherns, D.

    Published in Applied physics letters (28-11-2005)
    “…The structure and composition of threading dislocations in GaN grown by hydride vapor phase epitaxy have been examined by electron microscopy. Transmission…”
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    Journal Article
  2. 2

    Edge and screw dislocations as nonradiative centers in InGaN/GaN quantum well luminescence by Cherns, D., Henley, S. J., Ponce, F. A.

    Published in Applied physics letters (30-04-2001)
    “…Transmission electron microscopy (TEM) and scanning electron microscope cathodoluminescence (CL) have been used to determine the influence of edge and screw…”
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    Journal Article
  3. 3

    The growth of transparent conducting ZnO films by pulsed laser ablation by Henley, S.J., Ashfold, M.N.R., Cherns, D.

    Published in Surface & coatings technology (01-01-2004)
    “…The structure of undoped, Al-doped ZnO (AZO) and Ga-doped ZnO (GZO) thin films grown on sapphire and NaCl substrates by 193 nm pulsed laser ablation of a ZnO…”
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    Journal Article
  4. 4

    Electron holography studies of the charge on dislocations in GaN by Cherns, D, Jiao, C G

    Published in Physical review letters (12-11-2001)
    “…Off-axis electron holography in a transmission electron microscope is used to examine the charge on threading edge dislocations in n-GaN (0001). It is shown…”
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    Journal Article
  5. 5

    A complementary geometric model for the growth of GaN nanocolumns prepared by plasma-assisted molecular beam epitaxy by Foxon, C.T., Novikov, S.V., Hall, J.L., Campion, R.P., Cherns, D., Griffiths, I., Khongphetsak, S.

    Published in Journal of crystal growth (01-06-2009)
    “…In this article, we propose a new complementary geometrical growth mechanism, which may partially explain some of the apparent anomalies in our understanding…”
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    Journal Article
  6. 6

    Defect reduction in GaN/(0001)sapphire films grown by molecular beam epitaxy using nanocolumn intermediate layers by Cherns, D., Meshi, L., Griffiths, I., Khongphetsak, S., Novikov, S. V., Farley, N., Campion, R. P., Foxon, C. T.

    Published in Applied physics letters (24-03-2008)
    “…Transmission and scanning electron microscopies are used to examine the epitaxial lateral overgrowth of GaN on GaN nanocolumns grown on AlN/(0001)sapphire by…”
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    Journal Article
  7. 7

    Hydrogen Adsorption at Strained Pd Nanoshells by Montes de Oca, M. G, Kumarakuru, H, Cherns, D, Fermín, D. J

    Published in Journal of physical chemistry. C (02-06-2011)
    “…Electrochemically induced hydrogen adsorption at Au–Pd core–shell (CS) nanostructures was investigated as a function of the Pd lattice strain. CS nanoparticles…”
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    Journal Article
  8. 8

    CVD PREPARED Mn-DOPED ZnO NANOWIRES by Phan, T.L., Vincent, R., Cherns, D., Nghia, N.X.

    “…Mn-doped ZnO nanowires prepared by chemical vapor deposition (CVD) were obtained in the temperature range of 450–500°C. X-ray diffraction patterns, SEM and TEM…”
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    Journal Article
  9. 9

    Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy by GRIFFITHS, IJ, CHERNS, D, ALBERT, S., BENGOECHEA‐ENCABO, A., ANGEL SANCHEZ, M., CALLEJA, E., SCHIMPKE, T., STRASSBURG, M.

    Published in Journal of microscopy (Oxford) (01-05-2016)
    “…Summary 3D InGaN/GaN microstructures grown by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) have been extensively studied using a…”
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    Journal Article
  10. 10

    Molecular beam epitaxy of InN nanorods on Si- and C-faces of SiC substrates by Goff, L.E., Powell, R.E.L., Kent, A.J., Foxon, C.T., Novikov, S.V., Webster, R., Cherns, D.

    Published in Journal of crystal growth (15-01-2014)
    “…The Plasma-Assisted Molecular Beam Epitaxy (PA-MBE) of InN nanorods on Si- and C-faces of 6H–SiC substrates has been demonstrated. The optimum PA-MBE growth…”
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    Journal Article
  11. 11

    Light emission and microstructure of Mg-doped AlGaN grown on patterned sapphire by Bell, A., Liu, R., Ponce, F. A., Amano, H., Akasaki, I., Cherns, D.

    Published in Applied physics letters (20-01-2003)
    “…Distinct crystalline and optical properties have been observed in Mg-doped Al0.03Ga0.97N grown on a patterned sapphire substrate; the pattern consisting of…”
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    Journal Article
  12. 12

    Controlling the size and alignment of ZnO microrods using ZnO thin film templates deposited by pulsed laser ablation by HENLEY, S. J, ASHFOLD, M. N. R, NICHOLLS, D. P, WHEATLEY, P, CHERNS, D

    “…The production of dense arrays of well aligned ZnO nano- and microrods with a controllable distribution of diameters is demonstrated. The rods were grown using…”
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    Conference Proceeding Journal Article
  13. 13

    The structure and properties of dislocations in GaN by Cherns, D, Hawkridge, M E

    Published in Journal of materials science (01-05-2006)
    “…Transmission electron microscopy studies of the core structure and optoelectronic properties of dislocations in GaN films are described. It is shown that the…”
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    Journal Article
  14. 14

    Growth of nanostructured ZnO thin films on sapphire by Doherty, R.P., Sun, Yuekui, Sun, Ye, Warren, J.L., Fox, N.A., Cherns, D., Ashfold, M.N.R.

    “…Growth of ZnO nanostructures on c-plane sapphire has been investigated using three different methods. Pulsed laser deposition (PLD) at low incident pulse…”
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    Journal Article
  15. 15

    The growth of In0.5Ga0.5N and InN layers on (111)Si using nanorod intermediate arrays by Cherns, D., Webster, R.F., Novikov, S.V., Foxon, C.T., Fischer, A.M., Ponce, F.A.

    Published in Journal of crystal growth (01-12-2013)
    “…Molecular beam epitaxy has been used to grow continuous overlayers of In0.5Ga0.5N and InN on (111)Si, via growth of an intermediate nanorod arrays…”
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    Journal Article
  16. 16

    Characterization of dislocations in GaN by transmission electron diffraction and microscopy techniques by Ponce, F. A., Cherns, D., Young, W. T., Steeds, J. W.

    Published in Applied physics letters (05-08-1996)
    “…A combination of transmission electron microscopy imaging and diffraction techniques is used to characterize crystal defects in homoepitaxial GaN thin films…”
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    Journal Article
  17. 17

    Lateral migration of dislocations in oxygen-doped GaN grown by molecular beam epitaxy by Hawkridge, M., Cherns, D., Myers, T.

    Published in Applied physics letters (18-12-2006)
    “…Threading dislocations in gallium nitride epilayers intermittently doped with oxygen were examined using transmission electron microscopy. Dislocations of all…”
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    Journal Article
  18. 18

    TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures by Cherns, D.

    “…This paper describes how transmission electron microscopy (TEM) can be used to study the structure and electronic properties of threading defects in GaN…”
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    Journal Article Conference Proceeding
  19. 19
  20. 20

    Open core threading dislocations in GaN grown by hydride vapour phase epitaxy by Cherns, D., Hawkridge, M. E.

    Published in Philosophical magazine (Abingdon, England) (11-10-2006)
    “…Three types of threading dislocation in (0001) GaN films (c, c + a, and a-type) have been observed to have hollow cores, depending on the method of growth and…”
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    Journal Article