Search Results - "C, Alan Y. Otero"
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n-MOS transistor impact ionization boosted by cumulative stress degradation in a 250 nm SiGe BiCMOS technology
Published in IEEE journal of the Electron Devices Society (01-01-2023)“…We introduce experimental observations of impact ionization in an n-type MOSFET of a 250 nm SiGe BiCMOS technology when operated under an aging test setup at…”
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Journal Article -
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n-MOS transistor impact ionization boosted by cumulative stress degradation in a 250 nm SiGe BiCMOS technology
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04-07-2022)“…We introduce experimental observations of impact ionization boosting in n-type MOSFET of a 250 nm SiGe BiCMOS technology, when operated under aging test…”
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Conference Proceeding