Search Results - "Byun, C. W."

Photo-Stable Transparent Nonvolatile Memory Thin-Film Transistors Using In-Ga-Zn-O Channel and ZnO Charge-Trap Layers by Kim, S. J., Lee, W. H., Byun, C. W., Hwang, C. S., Yoon, S. M.

“…We propose fully transparent charge-trap-type memory thin-film transistors (TFTs) with a top-gate structure composed of ZnO charge-trap and In-Ga-Zn-O active…”
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Improved charging phenomenon with a modified barrier structure for flexible displays fabricated on polyimide substrates by Kim, H.J., Park, J.M., Byun, C.W., Bak, S.R., Jung, Y.J., Han, C.H., Yoo, J.M., Kim, S.K., Choi, P.H., Lee, J.H., Song, J.K., Choi, B.D.

“…In a previous study, the authors investigated that abnormal Vth behaviour could occur due to polyimide charging when a voltage was applied to the gate in thin…”
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Photo-Stable Transparent Nonvolatile Memory Thin-Film Transistors Using In-G-Zn-O Channel and ZnO Charge-Trap Layers by Kim, S J, Lee, W H, Byun, C W, Hwang, C S, Yoon, S M

“…We propose fully transparent charge-trap-type memory thin-film transistors (TFTs) with a top-gate structure composed of ZnO charge-trap and In-G-Zn-O active…”
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The effect of cluster size on media noise in Co-Ni-P thin films by Rauch, G.C., Byun, C., Johns, E.R.C., Messinger, C., Greggi, J.

“…In the columnar microstructure of electroplated Co-Ni-P thin-film media there exist groups of columns with identical crystallographic orientation. Such groups…”
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